Inventor
ROBERTAZZI RAPHAEL P
US10 patents
Patents
10 patentsUS9568540B2Feb 14, 2017
Method for the characterization and monitoring of integrated circuits
IBM7 citations83
US10429433B2Oct 1, 2019
Method for the characterization and monitoring of integrated circuits
IBM1 citations72
US10379152B2Aug 13, 2019
Method for the characterization and monitoring of integrated circuits
IBM1 citations72
US10102090B2Oct 16, 2018
Non-destructive analysis to determine use history of processor
IBM2 citations71
US9784790B2Oct 10, 2017
Method for testing through silicon vias in 3D integrated circuits
IBM2 citations70
US11169200B2Nov 9, 2021
Method for the characterization and monitoring of integrated circuits
IBM0 citations62
US11061063B2Jul 13, 2021
Method for the characterization and monitoring of integrated circuits
IBM0 citations62
US10491610B2Nov 26, 2019
Remote monitoring of software
IBM1 citations62
US10552278B2Feb 4, 2020
Non-destructive analysis to determine use history of processor
IBM0 citations51
US11105856B2Aug 31, 2021
Detection of performance degradation in integrated circuits
IBM0 citations48