Inventor

SAITO YASUKO

JP5 patents

⚠️ This page may combine multiple inventors who share the name “SAITO YASUKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NEC CORP

3 patents

US7664307B2Feb 16, 2010

Photomask manufacturing support system

NEC CORP2 citations57

US7577287B2Aug 18, 2009

Early error detection during fabrication of reticles

NEC CORP0 citations36

US7441226B2Oct 21, 2008

Method, system, apparatus and program for programming defect data for evaluation of reticle inspection apparatus

NEC CORP0 citations36

ADVANCED MASK INSPECTION TECH

1 patent

US7275006B2Sep 25, 2007

Workpiece inspection apparatus assisting device, workpiece inspection method and computer-readable recording media storing program therefor

ADVANCED MASK INSPECTION TECH4 citations59

TOHOKU TECHNO ARCH CO LTD

1 patent

US7123004B2Oct 17, 2006

Method of non-destructive inspection of rear surface flaws and material characteristics using electromagnetic technique and apparatus therefor

TOHOKU TECHNO ARCH CO LTD2 citations51