Inventor
YANG CHENG-JER
CN16 patents
⚠️ This page may combine multiple inventors who share the name “YANG CHENG-JER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHANGXIN MEMORY TECH INC
13 patentsUS12293979B2May 6, 2025
Memory structure including elastic material based buffer column structure near contact structure to improve stability of connection
CHANGXIN MEMORY TECH INC0 citations61
US12033691B2Jul 9, 2024
Readout circuit layout structure, readout circuit, and memory layout structure
CHANGXIN MEMORY TECH INC1 citations61
US12519014B2Jan 6, 2026
Semiconductor structure including an electrode cover layer over a capacitor of a dynamic random access memory (DRAM) formed in a substrate, and a contact structure electrically connected to the electrode cover layer, and method of making the same
CHANGXIN MEMORY TECH INC0 citations50
US12341132B2Jun 24, 2025
Semiconductor structure
CHANGXIN MEMORY TECH INC0 citations50
US11929132B2Mar 12, 2024
Testing method, testing system, and testing apparatus for semiconductor chip
CHANGXIN MEMORY TECH INC0 citations50
US11892502B2Feb 6, 2024
Through-silicon via (TSV) fault-tolerant circuit, method for TSV fault-tolerance and integrated circuit (IC)
CHANGXIN MEMORY TECH INC0 citations50
US11886733B2Jan 30, 2024
Circuit for testing a memory and test method thereof
CHANGXIN MEMORY TECH INC0 citations50
US11869576B2Jan 9, 2024
Word line driving circuit and dynamic random access memory
CHANGXIN MEMORY TECH INC0 citations50
US11862269B2Jan 2, 2024
Testing method for packaged chip, testing system for packaged chip, computer device and storage medium
CHANGXIN MEMORY TECH INC0 citations50
US11830553B2Nov 28, 2023
Word line drive circuit and dynamic random access memory
CHANGXIN MEMORY TECH INC0 citations50
US11715543B2Aug 1, 2023
Memory test circuit apparatus and test method
CHANGXIN MEMORY TECH INC0 citations50
US11340294B2May 24, 2022
Boundary test circuit, memory and boundary test method
CHANGXIN MEMORY TECH INC0 citations50
US11614481B2Mar 28, 2023
Through-silicon via detecting circuit, detecting methods and integrated circuit thereof
CHANGXIN MEMORY TECH INC0 citations44