Inventor
LIN HUNG-CHIH
TW95 patents
⚠️ This page may combine multiple inventors who share the name “LIN HUNG-CHIH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
26 patentsUS9664707B2May 30, 2017
Testing holders for chip unit and die package
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations93
US9453877B2Sep 27, 2016
Testing holders for chip unit and die package
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations93
US10698026B2Jun 30, 2020
Testing holders for chip unit and die package
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations84
US10652987B2May 12, 2020
Three dimensional integrated circuit electrostatic discharge protection and prevention test interface
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10067181B2Sep 4, 2018
Testing holders for chip unit and die package
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US9671457B2Jun 6, 2017
3D IC testing apparatus
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US9252593B2Feb 2, 2016
Three dimensional integrated circuit electrostatic discharge protection and prevention test interface
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US9658281B2May 23, 2017
Alignment testing for tiered semiconductor structure
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations83
US9372227B2Jun 21, 2016
Integrated circuit test system and method
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations83
US11340291B2May 24, 2022
Testing holders for chip unit and die package
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11029331B2Jun 8, 2021
Universal test mechanism for semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9900970B2Feb 20, 2018
Three dimensional integrated circuit electrostatic discharge protection and prevention test interface
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9859176B1Jan 2, 2018
Semiconductor device, test system and method of the same
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9754847B2Sep 5, 2017
Circuit probing structures and methods for probing the same
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9568543B2Feb 14, 2017
Structure and method for testing stacked CMOS structure
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations73
US9417285B2Aug 16, 2016
Integrated fan-out package-on-package testing
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US10641819B2May 5, 2020
Alignment testing for tiered semiconductor structure
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations72
US10073135B2Sep 11, 2018
Alignment testing for tiered semiconductor structure
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US9891266B2Feb 13, 2018
Test circuit and method
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US9653927B2May 16, 2017
Composite integrated circuits and methods for wireless interactions therewith
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11579190B2Feb 14, 2023
Testing holders for chip unit and die package
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11229109B2Jan 18, 2022
Three dimensional integrated circuit electrostatic discharge protection and prevention test interface
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11585831B2Feb 21, 2023
Test probing structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11387683B2Jul 12, 2022
Composite integrated circuits and methods for wireless interactions therewith
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11231453B2Jan 25, 2022
Alignment testing for tiered semiconductor structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11199578B2Dec 14, 2021
Testing apparatus and testing method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
MEDIATEK INC
12 patentsUS10282814B2May 7, 2019
Method and apparatus of image formation and compression of cubic images for 360 degree panorama display
MEDIATEK INC11 citations84
US10380715B2Aug 13, 2019
Method and apparatus for generating and encoding projection-based frame with 360-degree content represented by triangular projection faces packed in octahedron projection layout
MEDIATEK INC6 citations83
US10643370B2May 5, 2020
Method and apparatus for generating projection-based frame with 360-degree image content represented by triangular projection faces assembled in octahedron projection layout
MEDIATEK INC2 citations73
US10462484B2Oct 29, 2019
Video encoding method and apparatus with syntax element signaling of employed projection layout and associated video decoding method and apparatus
MEDIATEK INC5 citations73
US9923387B2Mar 20, 2018
Multi-mode wireless receiver apparatus and resonator circuit design
MEDIATEK INC4 citations73
US10614609B2Apr 7, 2020
Method and apparatus for reduction of artifacts at discontinuous boundaries in coded virtual-reality images
MEDIATEK INC2 citations72
US10593012B2Mar 17, 2020
Method and apparatus for generating and encoding projection-based frame with 360-degree content represented in projection faces packed in segmented sphere projection layout
MEDIATEK INC2 citations72
US10560678B2Feb 11, 2020
Method and apparatus having video encoding function with syntax element signaling of rotation information of content-oriented rotation applied to 360-degree image content or 360-degree video content represented in projection format and associated method and apparatus having video decoding function
MEDIATEK INC4 citations72
US10368067B2Jul 30, 2019
Method and apparatus for selective filtering of cubic-face frames
MEDIATEK INC4 citations72
US10264282B2Apr 16, 2019
Method and apparatus of inter coding for VR video using virtual reference frames
MEDIATEK INC4 citations72
US9559583B2Jan 31, 2017
Power converter with a wave generator that filters a wave signal to generate an output voltage
MEDIATEK INC2 citations72
US10972730B2Apr 6, 2021
Method and apparatus for selective filtering of cubic-face frames
MEDIATEK INC0 citations62
WANG MILL-JER
6 patentsUS9086452B2Jul 21, 2015
Three-dimensional integrated circuit and method for wireless information access thereof
WANG MILL-JER26 citations92
US8957691B2Feb 17, 2015
Probe cards for probing integrated circuits
WANG MILL-JER12 citations84
US8922230B2Dec 30, 2014
3D IC testing apparatus
WANG MILL-JER10 citations84
US8866488B2Oct 21, 2014
Power compensation in 3DIC testing
WANG MILL-JER4 citations73
US9817029B2Nov 14, 2017
Test probing structure
WANG MILL-JER4 citations72
US9129973B2Sep 8, 2015
Circuit probing structures and methods for probing the same
WANG MILL-JER2 citations63
LIN HUNG-CHIH
2 patentsTAIWAN SEMICONDUCTOR MFG
1 patentGRAND MOTOMO LIGHTS CO LTD
1 patentAU OPTRONICS CORP
1 patentCHEN LI-YI
1 patentShowing the top 50 of 95 patents by PatentIndex Score.