Inventor
DE OBALDIA ELIDA ISABEL
US4 patents
Patents
4 patentsUS7254755B2Aug 7, 2007
On-chip receiver sensitivity test mechanism
TEXAS INSTRUMENTS INC39 citations91
US7813462B2Oct 12, 2010
Method of defining semiconductor fabrication process utilizing transistor inverter delay period
TEXAS INSTRUMENTS INC8 citations83
US7958408B2Jun 7, 2011
On-chip receiver sensitivity test mechanism
TEXAS INSTRUMENTS INC9 citations82
US7035750B2Apr 25, 2006
On-chip test mechanism for transceiver power amplifier and oscillator frequency
TEXAS INSTRUMENTS INC9 citations73