P

Inventor

YUN WENBING

US93 patents
⚠️ This page may combine multiple inventors who share the name “YUN WENBING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

XRADIA INC

26 patents
US7412024B1Aug 12, 2008

X-ray mammography

XRADIA INC70 citations98
US7268945B2Sep 11, 2007

Short wavelength metrology imaging system

XRADIA INC63 citations98
US7119953B2Oct 10, 2006

Phase contrast microscope for short wavelength radiation and imaging method

XRADIA INC68 citations98
US7974379B1Jul 5, 2011

Metrology and registration system and method for laminography and tomography

XRADIA INC56 citations97
US7920676B2Apr 5, 2011

CD-GISAXS system and method

XRADIA INC86 citations97
US7561662B2Jul 14, 2009

X-ray micro-tomography system optimized for high resolution, throughput, image quality

XRADIA INC52 citations97
US7406151B1Jul 29, 2008

X-ray microscope with microfocus source and Wolter condenser

XRADIA INC63 citations97
US7394890B1Jul 1, 2008

Optimized x-ray energy for high resolution imaging of integrated circuits structures

XRADIA INC85 citations97
US7245696B2Jul 17, 2007

Element-specific X-ray fluorescence microscope and method of operation

XRADIA INC100 citations97
US7215736B1May 8, 2007

X-ray micro-tomography system optimized for high resolution, throughput, image quality

XRADIA INC74 citations97
US7183547B2Feb 27, 2007

Element-specific X-ray fluorescence microscope and method of operation

XRADIA INC84 citations97
US7057187B1Jun 6, 2006

Scintillator optical system and method of manufacture

XRADIA INC84 citations97
US7443953B1Oct 28, 2008

Structured anode X-ray source for X-ray microscopy

XRADIA INC56 citations96
US7414787B2Aug 19, 2008

Phase contrast microscope for short wavelength radiation and imaging method

XRADIA INC48 citations96
US7400704B1Jul 15, 2008

High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source

XRADIA INC71 citations96
US7388942B2Jun 17, 2008

X-ray micro-tomography system optimized for high resolution, throughput, image quality

XRADIA INC49 citations96
US7365918B1Apr 29, 2008

Fast x-ray lenses and fabrication method therefor

XRADIA INC55 citations96
US7130375B1Oct 31, 2006

High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source

XRADIA INC95 citations96
US7095822B1Aug 22, 2006

Near-field X-ray fluorescence microprobe

XRADIA INC55 citations96
US6917472B1Jul 12, 2005

Achromatic fresnel optics for ultraviolet and x-ray radiation

XRADIA INC54 citations96
US6914723B2Jul 5, 2005

Reflective lithography mask inspection tool based on achromatic Fresnel optics

XRADIA INC60 citations96
US6885503B2Apr 26, 2005

Achromatic fresnel optics based lithography for short wavelength electromagnetic radiations

XRADIA INC46 citations96
US8353628B1Jan 15, 2013

Method and system for tomographic projection correction

XRADIA INC63 citations95
US7813475B1Oct 12, 2010

X-ray microscope with switchable x-ray source

XRADIA INC54 citations95
US7800072B2Sep 21, 2010

Low pass X-ray scintillator system

XRADIA INC38 citations95
US7796725B1Sep 14, 2010

Mechanism for switching sources in x-ray microscope

XRADIA INC52 citations95

SIGRAY INC

19 patents
US10295485B2May 21, 2019

X-ray transmission spectrometer system

SIGRAY INC46 citations98
US9874531B2Jan 23, 2018

X-ray method for the measurement, characterization, and analysis of periodic structures

SIGRAY INC60 citations98
US9823203B2Nov 21, 2017

X-ray surface analysis and measurement apparatus

SIGRAY INC70 citations98
US9719947B2Aug 1, 2017

X-ray interferometric imaging system

SIGRAY INC65 citations98
US9594036B2Mar 14, 2017

X-ray surface analysis and measurement apparatus

SIGRAY INC79 citations98
US9448190B2Sep 20, 2016

High brightness X-ray absorption spectroscopy system

SIGRAY INC64 citations98
US10653376B2May 19, 2020

X-ray imaging system

SIGRAY INC23 citations94
US10578566B2Mar 3, 2020

X-ray emission spectrometer system

SIGRAY INC26 citations94
US10466185B2Nov 5, 2019

X-ray interrogation system using multiple x-ray beams

SIGRAY INC24 citations94
US10416099B2Sep 17, 2019

Method of performing X-ray spectroscopy and X-ray absorption spectrometer system

SIGRAY INC38 citations94
US10401309B2Sep 3, 2019

X-ray techniques using structured illumination

SIGRAY INC31 citations94
US10349908B2Jul 16, 2019

X-ray interferometric imaging system

SIGRAY INC44 citations94
US10352880B2Jul 16, 2019

Method and apparatus for x-ray microscopy

SIGRAY INC29 citations94
US10304580B2May 28, 2019

Talbot X-ray microscope

SIGRAY INC30 citations94
US10295486B2May 21, 2019

Detector for X-rays with high spatial and high spectral resolution

SIGRAY INC26 citations94
US10247683B2Apr 2, 2019

Material measurement techniques using multiple X-ray micro-beams

SIGRAY INC41 citations94
US9543109B2Jan 10, 2017

X-ray sources using linear accumulation

SIGRAY INC39 citations94
US9449781B2Sep 20, 2016

X-ray illuminators with high flux and high flux density

SIGRAY INC52 citations94
US9390881B2Jul 12, 2016

X-ray sources using linear accumulation

SIGRAY INC48 citations94

YUN WENBING

2 patents

CARL ZEISS X RAY MICROSCOPY INC

1 patent

JACOBSEN CHRIS J

1 patent

ADLER DAVID L

1 patent

Showing the top 50 of 93 patents by PatentIndex Score.