Inventor

LIANG WEN-CHIN

TW2 patents

Patents

2 patents

US11513152B2Nov 29, 2022

Testing device and method

SILICONWARE PRECISION INDUSTRIES CO LTD0 citations54

US11531059B2Dec 20, 2022

Testing device for burn-in test operations and control method thereof

SILICONWARE PRECISION INDUSTRIES CO LTD0 citations51