Inventor
QIU HONG
CN29 patents
⚠️ This page may combine multiple inventors who share the name “QIU HONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SEIKO EPSON CORP
13 patentsUS6142615ANov 7, 2000
Ink-jet recording head with piezoelectric device and method for manufacturing the same
SEIKO EPSON CORP399 citations99
US6387225B1May 14, 2002
Thin piezoelectric film element, process for the preparation thereof and ink jet recording head using thin piezoelectric film element
SEIKO EPSON CORP50 citations96
US6294860B1Sep 25, 2001
Thin piezoelectric film element, process for the preparation thereof and ink jet recording head using thin piezoelectric film element
SEIKO EPSON CORP59 citations96
US6097133AAug 1, 2000
Thin piezoelectric film element, process for the preparation thereof and ink jet recording head using thin piezoelectric film element
SEIKO EPSON CORP68 citations96
US6419848B1Jul 16, 2002
Piezoelectric actuator, ink-jet type recording head, manufacturing method therefor, and ink-jet printer
SEIKO EPSON CORP31 citations92
US6419849B1Jul 16, 2002
Method for manufacturing piezoelectric material
SEIKO EPSON CORP37 citations92
US6411017B1Jun 25, 2002
Piezoelectric device, ink jet recording head, and methods of manufacturing said device and head
SEIKO EPSON CORP33 citations92
US6281617B1Aug 28, 2001
Piezoelectric luminous element, display device and method for manufacturing same
SEIKO EPSON CORP23 citations92
US6402304B1Jun 11, 2002
Piezoelectric actuator, ink jet printing head, printer, method for manufacturing piezoelectric actuator, and method for manufacturing ink jet printing head
SEIKO EPSON CORP27 citations90
US6571446B2Jun 3, 2003
Method for manufacturing piezoelectric luminous element
SEIKO EPSON CORP11 citations74
US6551652B2Apr 22, 2003
Process for producing a piezoelectric element using a first SOL and a second SOL having a lead content greater than the first SOL
SEIKO EPSON CORP8 citations74
US6455106B1Sep 24, 2002
Method of forming oxide-ceramics film
SEIKO EPSON CORP11 citations74
US6803702B2Oct 12, 2004
Piezoelectric element and method of manufacturing same
SEIKO EPSON CORP2 citations63
TOKYO ELECTRON LTD
6 patentsUS7783669B2Aug 24, 2010
Data flow management in generating profile models used in optical metrology
TOKYO ELECTRON LTD11 citations82
US7515283B2Apr 7, 2009
Parallel profile determination in optical metrology
TOKYO ELECTRON LTD0 citations48
US7765234B2Jul 27, 2010
Data flow management in generating different signal formats used in optical metrology
TOKYO ELECTRON LTD0 citations40
US7765076B2Jul 27, 2010
Allocating processing units to processing clusters to generate simulated diffraction signals
TOKYO ELECTRON LTD0 citations40
US7742888B2Jun 22, 2010
Allocating processing units to generate simulated diffraction signals used in optical metrology
TOKYO ELECTRON LTD0 citations40
US7469192B2Dec 23, 2008
Parallel profile determination for an optical metrology system
TOKYO ELECTRON LTD0 citations38
SYNAPTICS INC
3 patentsUS12562176B2Feb 24, 2026
Single-microphone acoustic echo and noise suppression
SYNAPTICS INC0 citations60
US12254860B2Mar 18, 2025
Dynamic range compression combined with active noise cancellation to remove artifacts caused by transient noises
SYNAPTICS INC0 citations57
US12057138B2Aug 6, 2024
Cascade audio spotting system
SYNAPTICS INC0 citations50
KLA TENCOR CORP
2 patentsUS10393647B1Aug 27, 2019
System, method, and computer program product for automatically determining a parameter causing an abnormal semiconductor metrology measurement
KLA TENCOR CORP4 citations66
US10190868B2Jan 29, 2019
Metrology system, method, and computer program product employing automatic transitioning between utilizing a library and utilizing regression for measurement processing
KLA TENCOR CORP2 citations66