Inventor

MUKHOPADHYAY SAIBAL

US10 patents

⚠️ This page may combine multiple inventors who share the name “MUKHOPADHYAY SAIBAL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

2 patents

US7642864B2Jan 5, 2010

Circuits and design structures for monitoring NBTI (negative bias temperature instability) effect and/or PBTI (positive bias temperature instability) effect

IBM35 citations91

US7673195B2Mar 2, 2010

Circuits and methods for characterizing device variation in electronic memory circuits

IBM0 citations51

PURDUE RESEARCH FOUNDATION

2 patents

US7508697B1Mar 24, 2009

Self-repairing technique in nano-scale SRAM to reduce parametric failures

PURDUE RESEARCH FOUNDATION48 citations91

US7304903B2Dec 4, 2007

Sense amplifier circuit

PURDUE RESEARCH FOUNDATION20 citations91

BAGHERI SAEED

2 patents

US8682634B2Mar 25, 2014

Analyzing a patterning process using a model of yield

BAGHERI SAEED5 citations72

US8880382B2Nov 4, 2014

Analyzing a patterning process using a model of yield

BAGHERI SAEED3 citations62

BANERJEE SHAYAK

2 patents

US8176444B2May 8, 2012

Analyzing multiple induced systematic and statistical layout dependent effects on circuit performance

BANERJEE SHAYAK5 citations71

US8418087B2Apr 9, 2013

Analyzing multiple induced systematic and statistical layout dependent effects on circuit performance

BANERJEE SHAYAK2 citations60

PURDUE RES FOUNDATION PURDUE U

1 patent

US7319343B2Jan 15, 2008

Low power scan design and delay fault testing technique using first level supply gating

PURDUE RES FOUNDATION PURDUE U4 citations53

CHUANG CHING-TE K

1 patent

US8086917B2Dec 27, 2011

Methods for characterizing device variation in electronic memory circuits

CHUANG CHING-TE K1 citations50