P

Inventor

RICH MARVIN J

US15 patents
⚠️ This page may combine multiple inventors who share the name “RICH MARVIN J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

14 patents
US7124071B2Oct 17, 2006

Partitioning a model into a plurality of independent partitions to be processed within a distributed environment

IBM70 citations94
US7085701B2Aug 1, 2006

Size reduction techniques for vital compliant VHDL simulation models

IBM17 citations84
US7272764B2Sep 18, 2007

Method, system, and program product for boundary I/O testing employing a logic built-in self-test of an integrated circuit

IBM13 citations83
US7856347B2Dec 21, 2010

Facilitating simulation of a model within a distributed environment

IBM10 citations82
US7444277B2Oct 28, 2008

Facilitating simulation of a model within a distributed environment

IBM11 citations82
US7137114B2Nov 14, 2006

Dynamically transferring license administrative responsibilities from a license server to one or more other license servers

IBM13 citations79
US7272761B2Sep 18, 2007

Method, system, and program product for controlling test data of a logic built-in self-test of an integrated circuit

IBM6 citations73
US6817000B2Nov 9, 2004

Delay correlation analysis and representation for vital complaint VHDL models

IBM10 citations73
US7158925B2Jan 2, 2007

Facilitating simulation of a model within a distributed environment

IBM6 citations72
US7409613B2Aug 5, 2008

Simultaneous AC logic self-test of multiple clock domains

IBM7 citations71
US7409614B2Aug 5, 2008

Method, system and program product for boundary I/O testing employing a logic built-in self-test of an integrated circuit

IBM4 citations62
US7146587B2Dec 5, 2006

Scalable logic self-test configuration for multiple chips

IBM2 citations62
US7231334B2Jun 12, 2007

Coupler interface for facilitating distributed simulation of a partitioned logic design

IBM3 citations61
US7412638B2Aug 12, 2008

Method, system, and program product for controlling test data of a logic built-in self-test of an integrated circuit

IBM0 citations51

MULLEN MICHAEL P

1 patent