Inventor
DUBUQUE JOHN P
US26 patents
⚠️ This page may combine multiple inventors who share the name “DUBUQUE JOHN P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
18 patentsUS7555740B2Jun 30, 2009
Method and system for evaluating statistical sensitivity credit in path-based hybrid multi-corner static timing analysis
IBM25 citations92
US8949765B2Feb 3, 2015
Modeling multi-patterning variability with statistical timing
IBM5 citations84
US8850378B2Sep 30, 2014
Hierarchical design of integrated circuits with multi-patterning requirements
IBM6 citations84
US8839167B1Sep 16, 2014
Reducing runtime and memory requirements of static timing analysis
IBM18 citations84
US8769452B2Jul 1, 2014
Parasitic extraction in an integrated circuit with multi-patterning requirements
IBM7 citations84
US7886246B2Feb 8, 2011
Methods for identifying failing timing requirements in a digital design
IBM7 citations84
US7681157B2Mar 16, 2010
Variable threshold system and method for multi-corner static timing analysis
IBM10 citations84
US7784003B2Aug 24, 2010
Estimation of process variation impact of slack in multi-corner path-based static timing analysis
IBM17 citations83
US8806402B2Aug 12, 2014
Modeling multi-patterning variability with statistical timing
IBM4 citations73
US7844932B2Nov 30, 2010
Method to identify timing violations outside of manufacturing specification limits
IBM4 citations63
US10970448B2Apr 6, 2021
Partial parameters and projection thereof included within statistical timing analysis
IBM0 citations62
US9378328B2Jun 28, 2016
Modeling multi-patterning variability with statistical timing
IBM2 citations62
US9348962B2May 24, 2016
Hierarchical design of integrated circuits with multi-patterning requirements
IBM2 citations62
US8056035B2Nov 8, 2011
Method and system for analyzing cross-talk coupling noise events in block-based statistical static timing
IBM5 citations62
US7797657B2Sep 14, 2010
Parameter ordering for multi-corner static timing analysis
IBM2 citations62
US10489540B2Nov 26, 2019
Integrating manufacturing feedback into integrated circuit structure design
IBM0 citations52
US9171124B2Oct 27, 2015
Parasitic extraction in an integrated circuit with multi-patterning requirements
IBM1 citations52
US10394982B2Aug 27, 2019
Partial parameters and projection thereof included within statistical timing analysis
IBM0 citations51
BUCK NATHAN C
5 patentsUS8468483B2Jun 18, 2013
Method, system and program storage device for performing a parameterized statistical static timing analysis (SSTA) of an integrated circuit taking into account setup and hold margin interdependence
BUCK NATHAN C9 citations83
US8141012B2Mar 20, 2012
Timing closure on multiple selective corners in a single statistical timing run
BUCK NATHAN C18 citations83
US8656207B2Feb 18, 2014
Method for modeling variation in a feedback loop of a phase-locked loop
BUCK NATHAN C5 citations72
US9858368B2Jan 2, 2018
Integrating manufacturing feedback into integrated circuit structure design
BUCK NATHAN C3 citations70
US8768679B2Jul 1, 2014
System and method for efficient modeling of NPskew effects on static timing tests
BUCK NATHAN C5 citations70