Inventor
WATANABE MASAFUMI
JP53 patents
⚠️ This page may combine multiple inventors who share the name “WATANABE MASAFUMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
18 patentsUS7752273B2Jul 6, 2010
Group communication system based on presence information and client device
NEC CORP65 citations97
US7844667B2Nov 30, 2010
Presence system and information processing equipment, dynamic buddy list generation method in presence system, and presence notification destination controlling method and its program for use with presence system
NEC CORP22 citations92
US7814120B2Oct 12, 2010
List management server for managing updating of list by third-party terminal, list management system, list managing method, and program
NEC CORP22 citations92
US7224973B2May 29, 2007
Communication agent apparatus
NEC CORP23 citations92
US10554383B2Feb 4, 2020
Analysis system, analysis method, and storage medium
NEC CORP2 citations71
US7953811B2May 31, 2011
Presence system and information processing equipment, dynamic buddy list generation method in presence system, and presence notification destination controlling method and its program for use with presence system
NEC CORP4 citations63
US7945679B2May 17, 2011
Presence service system, a presence apparatus, a presence service method, and a presence service program
NEC CORP2 citations63
US12045342B2Jul 23, 2024
Information processing device, display method, and non-transitory computer readable medium
NEC CORP0 citations62
US11847216B2Dec 19, 2023
Analysis device, analysis method and computer-readable recording medium
NEC CORP0 citations62
US11640463B2May 2, 2023
Analysis device, analysis method and computer-readable recording medium
NEC CORP0 citations62
US11436325B2Sep 6, 2022
Analysis device, analysis method, and storage medium in which analysis program is recorded
NEC CORP0 citations61
US10528730B2Jan 7, 2020
Analysis device, analysis method, and storage medium in which analysis program is recorded
NEC CORP1 citations61
US12061730B2Aug 13, 2024
Security assessment apparatus, security assessment method, and non-transitory computer readable medium
NEC CORP0 citations56
US11860604B2Jan 2, 2024
Analysis assistance apparatus, analysis assistance method, and computer-readable recording medium
NEC CORP0 citations52
US11579596B2Feb 14, 2023
Plant monitoring apparatus, plant monitoring method, and computer readable recording medium
NEC CORP0 citations52
US10360378B2Jul 23, 2019
Analysis device, analysis method and computer-readable recording medium
NEC CORP0 citations51
US10931468B2Feb 23, 2021
Analysis system, analysis method, and storage medium
NEC CORP0 citations50
US10536261B2Jan 14, 2020
Analysis system, analysis method, and storage medium
NEC CORP0 citations40
HITACHI HIGH TECH SCIENCE CORP
6 patentsUS9899198B2Feb 20, 2018
Method for analyzing evolved gas and evolved gas analyzer
HITACHI HIGH TECH SCIENCE CORP3 citations71
US8621660B2Dec 31, 2013
Probe shape evaluation method for a scanning probe microscope
HITACHI HIGH TECH SCIENCE CORP5 citations70
US11646188B2May 9, 2023
Apparatus and method for analyzing evolved gas
HITACHI HIGH TECH SCIENCE CORP0 citations50
US10161958B2Dec 25, 2018
Three-dimensional fine movement device
HITACHI HIGH TECH SCIENCE CORP0 citations42
US10151773B2Dec 11, 2018
Scanning probe microscope and probe contact detection method
HITACHI HIGH TECH SCIENCE CORP0 citations41
US10466271B2Nov 5, 2019
Scanning probe microscope and optical axis adjustment method for scanning probe microscope
HITACHI HIGH TECH SCIENCE CORP0 citations40
SII NANOTECHNOLOGY INC
5 patentsUS8024816B2Sep 20, 2011
Approach method for probe and sample in scanning probe microscope
SII NANOTECHNOLOGY INC13 citations83
US8001831B2Aug 23, 2011
Positioning apparatus and scanning probe microscope employing the same
SII NANOTECHNOLOGY INC2 citations63
US7926328B2Apr 19, 2011
Sample manipulating apparatus
SII NANOTECHNOLOGY INC2 citations63
US7427744B2Sep 23, 2008
Piezoelectric actuator and scanning probe microscope using the same
SII NANOTECHNOLOGY INC5 citations63
US7251987B2Aug 7, 2007
Scanning probe microscope and measuring method by means of the same
SII NANOTECHNOLOGY INC2 citations62
MITSUBISHI GAS CHEMICAL CO
4 patentsUS7153999B2Dec 26, 2006
Production of dimethylolcarboxylic acid
MITSUBISHI GAS CHEMICAL CO3 citations60
US7087800B2Aug 8, 2006
Process for producing a polyol
MITSUBISHI GAS CHEMICAL CO3 citations60
US7368612B2May 6, 2008
Method of producing high-purity hydroxypivalaldehyde and/or dimer thereof
MITSUBISHI GAS CHEMICAL CO2 citations59
US7456300B2Nov 25, 2008
Process of producing dioxane glycol
MITSUBISHI GAS CHEMICAL CO0 citations38
NEC ELECTRONICS CORP
3 patentsRENESAS ELECTRONICS CORP
3 patentsUS7990191B2Aug 2, 2011
Digital phase-locked loop
RENESAS ELECTRONICS CORP10 citations82
US10063277B2Aug 28, 2018
Clock control circuit, demodulation device and spread spectrum method
RENESAS ELECTRONICS CORP1 citations49
US9729194B2Aug 8, 2017
Clock control circuit, demodulation device and spread spectrum method
RENESAS ELECTRONICS CORP1 citations49
HITACHI HIGH-TECH SCIENCE CORP
3 patentsUS9831077B2Nov 28, 2017
Method for analyzing evolved gas and evolved gas analyzer
HITACHI HIGH-TECH SCIENCE CORP2 citations72
US9823208B2Nov 21, 2017
Method for measuring spreading resistance and spreading resistance microscope
HITACHI HIGH-TECH SCIENCE CORP1 citations51
US9766267B2Sep 19, 2017
Actuator position calculation device, actuator position calculation method, and actuator position calculation program
HITACHI HIGH-TECH SCIENCE CORP0 citations41
TOKYO SHIBAURA ELECTRIC CO
2 patentsWATANABE MASAFUMI
2 patentsTOSHIBA KK
1 patentYAZAKI CORP
1 patentITO NAOKO
1 patentYASUTAKE MASATOSHI
1 patentShowing the top 50 of 53 patents by PatentIndex Score.