Inventor
HUANG HUAI-YING
TW41 patents
⚠️ This page may combine multiple inventors who share the name “HUANG HUAI-YING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
25 patentsUS9431066B1Aug 30, 2016
Circuit having a non-symmetrical layout
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations73
US12040018B2Jul 16, 2024
Method for programming memory
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11527289B2Dec 13, 2022
Method for programming memory
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11404477B2Aug 2, 2022
Memory array and method of forming thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US12417806B2Sep 16, 2025
Method for programming memory
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12412787B2Sep 9, 2025
Manufacturing process with atomic level inspection
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12315560B2May 27, 2025
Integrated circuit device and manufacturing method of the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12281991B2Apr 22, 2025
Inspection layer to improve the detection of defects through optical systems and methods of inspecting semiconductor device for defects
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12131957B2Oct 29, 2024
Manufacturing process with atomic level inspection
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11974422B2Apr 30, 2024
Semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11856793B2Dec 26, 2023
Memory array and method of forming thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11761905B2Sep 19, 2023
Inspection layer to improve the detection of defects through optical systems and methods of inspecting semiconductor device for defects
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11744060B2Aug 29, 2023
Memory device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12575109B2Mar 10, 2026
Antiferroelectric non-volatile memory
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12424548B2Sep 23, 2025
Metallization layer and fabrication method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US12002755B2Jun 4, 2024
Metallization layer and fabrication method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US12309989B2May 20, 2025
Stacked SRAM device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12075608B2Aug 27, 2024
Multi-gate semiconductor device for memory and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10147729B2Dec 4, 2018
Structures, devices and methods for memory devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9761572B2Sep 12, 2017
Memory device layout, semiconductor device, and method of manufacturing memory device
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations52
US9425085B2Aug 23, 2016
Structures, devices and methods for memory devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12218014B2Feb 4, 2025
Method for non-destructive inspection of cell etch redeposition
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US11749569B2Sep 5, 2023
Method for non-destructive inspection of cell etch redeposition
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US9978755B2May 22, 2018
Methods and devices for intra-connection structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations42
US10020312B2Jul 10, 2018
Static random access memory
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations39
TAIWAN SEMICONDUCTOR MFG
9 patentsUS7773407B2Aug 10, 2010
8T low leakage SRAM cell
TAIWAN SEMICONDUCTOR MFG22 citations92
US7466581B2Dec 16, 2008
SRAM design with separated VSS
TAIWAN SEMICONDUCTOR MFG11 citations84
US8624327B2Jan 7, 2014
Integrated semiconductor structure for SRAM and fabrication methods thereof
TAIWAN SEMICONDUCTOR MFG14 citations83
US8947900B2Feb 3, 2015
Stable SRAM cell
TAIWAN SEMICONDUCTOR MFG2 citations63
US8908409B2Dec 9, 2014
Stable SRAM cell
TAIWAN SEMICONDUCTOR MFG2 citations63
US8743579B2Jun 3, 2014
Stable SRAM cell
TAIWAN SEMICONDUCTOR MFG3 citations63
US7869262B2Jan 11, 2011
Memory device with an asymmetric layout structure
TAIWAN SEMICONDUCTOR MFG5 citations63
US7279755B2Oct 9, 2007
SRAM cell with improved layout designs
TAIWAN SEMICONDUCTOR MFG6 citations61
US9362399B2Jun 7, 2016
Well implant through dummy gate oxide in gate-last process
TAIWAN SEMICONDUCTOR MFG1 citations51