P

Inventor

HUANG HUAI-YING

TW41 patents
⚠️ This page may combine multiple inventors who share the name “HUANG HUAI-YING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

25 patents
US9431066B1Aug 30, 2016

Circuit having a non-symmetrical layout

TAIWAN SEMICONDUCTOR MFG CO LTD6 citations73
US12040018B2Jul 16, 2024

Method for programming memory

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11527289B2Dec 13, 2022

Method for programming memory

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11404477B2Aug 2, 2022

Memory array and method of forming thereof

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US12417806B2Sep 16, 2025

Method for programming memory

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12412787B2Sep 9, 2025

Manufacturing process with atomic level inspection

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12315560B2May 27, 2025

Integrated circuit device and manufacturing method of the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12281991B2Apr 22, 2025

Inspection layer to improve the detection of defects through optical systems and methods of inspecting semiconductor device for defects

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12131957B2Oct 29, 2024

Manufacturing process with atomic level inspection

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11974422B2Apr 30, 2024

Semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11856793B2Dec 26, 2023

Memory array and method of forming thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11761905B2Sep 19, 2023

Inspection layer to improve the detection of defects through optical systems and methods of inspecting semiconductor device for defects

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11744060B2Aug 29, 2023

Memory device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12575109B2Mar 10, 2026

Antiferroelectric non-volatile memory

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12424548B2Sep 23, 2025

Metallization layer and fabrication method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US12002755B2Jun 4, 2024

Metallization layer and fabrication method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US12309989B2May 20, 2025

Stacked SRAM device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12075608B2Aug 27, 2024

Multi-gate semiconductor device for memory and method for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10147729B2Dec 4, 2018

Structures, devices and methods for memory devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9761572B2Sep 12, 2017

Memory device layout, semiconductor device, and method of manufacturing memory device

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations52
US9425085B2Aug 23, 2016

Structures, devices and methods for memory devices

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12218014B2Feb 4, 2025

Method for non-destructive inspection of cell etch redeposition

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US11749569B2Sep 5, 2023

Method for non-destructive inspection of cell etch redeposition

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US9978755B2May 22, 2018

Methods and devices for intra-connection structures

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations42
US10020312B2Jul 10, 2018

Static random access memory

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations39

TAIWAN SEMICONDUCTOR MFG

9 patents

CHANG FENG-MING

2 patents

HUNG SHENG CHIANG

2 patents

HUANG HUAI-YING

1 patent

TAIWAN SEMIOCONDUCTOR MFG CO L

1 patent

LIN TZU-KUEI

1 patent