Inventor
JEOUN ILL-HWAN
KR3 patents
Patents
3 patentsUS5893050AApr 6, 1999
Method for correcting thin-film formation program of semiconductor device and thickness measuring apparatus therefor
SAMSUNG ELECTRONICS CO LTD30 citations89
US6303999B1Oct 16, 2001
Interconnect structure with a passivation layer and chip pad
SAMSUNG ELECTRONICS CO LTD12 citations68
US6596633B2Jul 22, 2003
Method for manufacturing a semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations46