Inventor
DONZE RICHARD LEE
US11 patents
Patents
11 patentsUS7227183B2Jun 5, 2007
Polysilicon conductor width measurement for 3-dimensional FETs
IBM197 citations98
US7183780B2Feb 27, 2007
Electrical open/short contact alignment structure for active region vs. gate region
IBM62 citations97
US7241649B2Jul 10, 2007
FinFET body contact structure
IBM18 citations92
US7317605B2Jan 8, 2008
Method and apparatus for improving performance margin in logic paths
IBM11 citations83
US7696565B2Apr 13, 2010
FinFET body contact structure
IBM3 citations62
US7317217B2Jan 8, 2008
Semiconductor scheme for reduced circuit area in a simplified process
IBM2 citations62
US7935629B2May 3, 2011
Semiconductor scheme for reduced circuit area in a simplified process
IBM0 citations52
US7626220B2Dec 1, 2009
Semiconductor scheme for reduced circuit area in a simplified process
IBM0 citations52
US7336086B2Feb 26, 2008
Measurement of bias of a silicon area using bridging vertices on polysilicon shapes to create an electrical open/short contact structure
IBM0 citations51
US7659733B2Feb 9, 2010
Electrical open/short contact alignment structure for active region vs. gate region
IBM0 citations49
US7453272B2Nov 18, 2008
Electrical open/short contact alignment structure for active region vs. gate region
IBM0 citations47