Inventor
KURATA YASUSHI
JP38 patents
⚠️ This page may combine multiple inventors who share the name “KURATA YASUSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI CHEMICAL CO LTD
26 patentsUS6221118B1Apr 24, 2001
Cerium oxide abrasive and method of polishing substrates
HITACHI CHEMICAL CO LTD123 citations98
US6420269B2Jul 16, 2002
Cerium oxide abrasive for polishing insulating films formed on substrate and methods for using the same
HITACHI CHEMICAL CO LTD97 citations97
US6863700B2Mar 8, 2005
Cerium oxide abrasive and method of polishing substrates
HITACHI CHEMICAL CO LTD37 citations96
US6343976B1Feb 5, 2002
Abrasive, method of polishing wafer, and method of producing semiconductor device
HITACHI CHEMICAL CO LTD60 citations96
US6783434B1Aug 31, 2004
CMP abrasive, liquid additive for CMP abrasive and method for polishing substrate
HITACHI CHEMICAL CO LTD61 citations94
US7367870B2May 6, 2008
Polishing fluid and polishing method
HITACHI CHEMICAL CO LTD29 citations92
US5728213AMar 17, 1998
Method of growing a rare earth silicate single crystal
HITACHI CHEMICAL CO LTD38 citations92
US5690731ANov 25, 1997
Method of growing single crystal
HITACHI CHEMICAL CO LTD32 citations92
US7838482B2Nov 23, 2010
CMP polishing compound and polishing method
HITACHI CHEMICAL CO LTD15 citations91
US7618491B2Nov 17, 2009
Scintillator single crystal and production method of same
HITACHI CHEMICAL CO LTD25 citations91
US7837800B2Nov 23, 2010
CMP polishing slurry and polishing method
HITACHI CHEMICAL CO LTD10 citations83
US7799688B2Sep 21, 2010
Polishing fluid and method of polishing
HITACHI CHEMICAL CO LTD8 citations83
US7749323B2Jul 6, 2010
Single crystal for scintillator and method for manufacturing same
HITACHI CHEMICAL CO LTD12 citations83
US7531036B2May 12, 2009
Single crystal heat treatment method
HITACHI CHEMICAL CO LTD14 citations83
US7319072B2Jan 15, 2008
Polishing medium for chemical-mechanical polishing, and method of polishing substrate member
HITACHI CHEMICAL CO LTD13 citations82
US7232529B1Jun 19, 2007
Polishing compound for chemimechanical polishing and polishing method
HITACHI CHEMICAL CO LTD14 citations82
US7708788B2May 4, 2010
Cerium oxide abrasive and method of polishing substrates
HITACHI CHEMICAL CO LTD6 citations73
US7115021B2Oct 3, 2006
Abrasive, method of polishing target member and process for producing semiconductor device
HITACHI CHEMICAL CO LTD8 citations73
US5667583ASep 16, 1997
Method of producing a single crystal of a rare-earth silicate
HITACHI CHEMICAL CO LTD8 citations73
US7311855B2Dec 25, 2007
Polishing slurry for chemical mechanical polishing and method for polishing substrate
HITACHI CHEMICAL CO LTD7 citations72
US7163644B2Jan 16, 2007
CMP abrasive, liquid additive for CMP abrasive and method for polishing substrate
HITACHI CHEMICAL CO LTD8 citations72
US7963825B2Jun 21, 2011
Abrasive, method of polishing target member and process for producing semiconductor device
HITACHI CHEMICAL CO LTD1 citations62
US7871308B2Jan 18, 2011
Abrasive, method of polishing target member and process for producing semiconductor device
HITACHI CHEMICAL CO LTD1 citations62
US7744666B2Jun 29, 2010
Polishing medium for chemical-mechanical polishing, and method of polishing substrate member
HITACHI CHEMICAL CO LTD4 citations60
US7867303B2Jan 11, 2011
Cerium oxide abrasive and method of polishing substrates
HITACHI CHEMICAL CO LTD0 citations52
US9714262B2Jul 25, 2017
Composition for forming passivation layer, semiconductor substrate having passivation layer, method of producing semiconductor substrate having passivation layer, photovoltaic cell element, method of producing photovoltaic cell element and photovoltaic cell
HITACHI CHEMICAL CO LTD1 citations51
MEIJI SEIKA KAISHA
3 patentsUS6077840AJun 20, 2000
Tetrahydrobenzindolone derivatives
MEIJI SEIKA KAISHA58 citations91
US5789602AAug 4, 1998
Physiologically active substances PF1092A, PF1092B and PF1092C, process for the production thereof, and contraceptives and anticancer drugs containing the same as active ingredients
MEIJI SEIKA KAISHA7 citations69
US5712306AJan 27, 1998
Physiologically active substances PF1092A, PF1092B and PF1092C, and contraceptives and anticancer drugs containing the same as active ingredients
MEIJI SEIKA KAISHA1 citations48
YOSHIDA MASATO
3 patentsUS8616936B2Dec 31, 2013
Abrasive, method of polishing target member and process for producing semiconductor device
YOSHIDA MASATO1 citations62
US8162725B2Apr 24, 2012
Abrasive, method of polishing target member and process for producing semiconductor device
YOSHIDA MASATO1 citations62
US8137159B2Mar 20, 2012
Abrasive, method of polishing target member and process for producing semiconductor device
YOSHIDA MASATO1 citations62