P

Inventor

CHANG WEN-YAN

TW25 patents
⚠️ This page may combine multiple inventors who share the name “CHANG WEN-YAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ALTEK SEMICONDUCTOR CORP

17 patents
US9325899B1Apr 26, 2016

Image capturing device and digital zooming method thereof

ALTEK SEMICONDUCTOR CORP65 citations95
US8903233B1Dec 2, 2014

Auto-focus system using multiple lenses and method thereof

ALTEK SEMICONDUCTOR CORP12 citations81
US9661305B2May 23, 2017

Image capture device, depth generating device and method thereof

ALTEK SEMICONDUCTOR CORP4 citations72
US8909037B1Dec 9, 2014

Auto-focus system using multiple lenses and method thereof

ALTEK SEMICONDUCTOR CORP4 citations72
US9225909B1Dec 29, 2015

Image capturing device and digital zoom display method

ALTEK SEMICONDUCTOR CORP5 citations71
US9747694B2Aug 29, 2017

Method and apparatus for optimizing depth information

ALTEK SEMICONDUCTOR CORP5 citations67
US10165248B2Dec 25, 2018

Optimization method of image depth information and image processing apparatus

ALTEK SEMICONDUCTOR CORP2 citations66
US9342875B2May 17, 2016

Method for generating image bokeh effect and image capturing device

ALTEK SEMICONDUCTOR CORP3 citations63
US9386229B2Jul 5, 2016

Image processing system and method for object-tracing

ALTEK SEMICONDUCTOR CORP2 citations61
US10798288B2Oct 6, 2020

Multi-camera electronic device and control method thereof

ALTEK SEMICONDUCTOR CORP1 citations60
US9100584B1Aug 4, 2015

Camera array correction method

ALTEK SEMICONDUCTOR CORP3 citations58
US11615536B2Mar 28, 2023

Image detection device and image detection method

ALTEK SEMICONDUCTOR CORP0 citations52
US11495015B2Nov 8, 2022

Object detection device and object detection method based on neural network

ALTEK SEMICONDUCTOR CORP0 citations51
US9210303B2Dec 8, 2015

Lens distortion correction method

ALTEK SEMICONDUCTOR CORP1 citations51
US9344629B2May 17, 2016

Method of capturing images and image capturing device using the method

ALTEK SEMICONDUCTOR CORP1 citations50
US8897589B2Nov 25, 2014

Method of detecting subject of image and imaging device thereof

ALTEK SEMICONDUCTOR CORP0 citations41
US10235773B2Mar 19, 2019

Image capturing device and calibration method of phase detection autofocus thereof

ALTEK SEMICONDUCTOR CORP0 citations40

YANG TAI-CHANG

3 patents

CHANG WEN-YAN

2 patents

CHANG YIN-PIN

2 patents

CHOU HONG-LONG

1 patent