Inventor
CHANG CHIH-CHIEN
TW26 patents
⚠️ This page may combine multiple inventors who share the name “CHANG CHIH-CHIEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
11 patentsUS10332884B2Jun 25, 2019
FinFET semiconductor device
UNITED MICROELECTRONICS CORP13 citations82
US9583641B1Feb 28, 2017
Semiconductor device and manufacturing method thereof
UNITED MICROELECTRONICS CORP17 citations82
US10192874B2Jan 29, 2019
Nonvolatile memory cell and fabrication method thereof
UNITED MICROELECTRONICS CORP6 citations73
US9666680B1May 30, 2017
Flash cell and forming process thereof
UNITED MICROELECTRONICS CORP4 citations72
US11990546B2May 21, 2024
Semiconductor device
UNITED MICROELECTRONICS CORP0 citations62
US11631766B2Apr 18, 2023
Semiconductor device
UNITED MICROELECTRONICS CORP0 citations62
US10020385B2Jul 10, 2018
Memory cell and manufacturing method thereof
UNITED MICROELECTRONICS CORP1 citations51
US12249647B2Mar 11, 2025
Power device and fabrication method thereof
UNITED MICROELECTRONICS CORP0 citations50
US9224857B2Dec 29, 2015
Semiconductor structure and method for manufacturing the same
UNITED MICROELECTRONICS CORP0 citations41
US10651183B1May 12, 2020
Manufacturing method of semiconductor device
UNITED MICROELECTRONICS CORP0 citations39
US10141194B1Nov 27, 2018
Manufacturing method of semiconductor structure
UNITED MICROELECTRONICS CORP0 citations34
TAIWAN SEMICONDUCTOR MFG
6 patentsUS7816217B2Oct 19, 2010
Multi-step epitaxial process for depositing Si/SiGe
TAIWAN SEMICONDUCTOR MFG17 citations84
US7612389B2Nov 3, 2009
Embedded SiGe stressor with tensile strain for NMOS current enhancement
TAIWAN SEMICONDUCTOR MFG9 citations84
US7142938B2Nov 28, 2006
Manufacturing management system and method
TAIWAN SEMICONDUCTOR MFG9 citations65
US7732289B2Jun 8, 2010
Method of forming a MOS device with an additional layer
TAIWAN SEMICONDUCTOR MFG2 citations63
US7129184B2Oct 31, 2006
Method of depositing an epitaxial layer of SiGe subsequent to a plasma etch
TAIWAN SEMICONDUCTOR MFG4 citations63
US7587293B2Sep 8, 2009
Semiconductor CP (circuit probe) test management system and method
TAIWAN SEMICONDUCTOR MFG2 citations54
REALTEK SEMICONDUCTOR CORP
4 patentsUS9740223B1Aug 22, 2017
Regulator
REALTEK SEMICONDUCTOR CORP11 citations81
US9760105B1Sep 12, 2017
Regulator
REALTEK SEMICONDUCTOR CORP3 citations72
US11146281B2Oct 12, 2021
Multi-stage switched capacitor circuit and operation method thereof
REALTEK SEMICONDUCTOR CORP0 citations51
US10067521B2Sep 4, 2018
Low dropout regulator with PMOS power transistor
REALTEK SEMICONDUCTOR CORP0 citations39