Inventor

DODDI SRINIVAS

US18 patents

⚠️ This page may combine multiple inventors who share the name “DODDI SRINIVAS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

DODDI SRINIVAS

TIMBRE TECH INC

Model and parameter selection for optical metrology

Profile refinement for integrated circuit metrology

Metrology hardware adaptation with universal library

System and method for grating profile classification

Clustering for data compression

Selection of wavelengths for integrated circuit optical metrology

Optimization of diffraction order selection for two-dimensional structures

Integrated circuit profile value determination

Selecting a hypothetical profile to use in optical metrology

Model and parameter selection for optical metrology

Clustering for data compression

Selection of wavelengths for integrated circuit optical metrology

TOKYO ELECTRON LTD

Optical metrology of structures formed on semiconductor wafers using machine learning systems

Selecting a profile model for use in optical metrology using a machine learning system

LAI YA-CHIEH

Method and system for model-based design and layout of an integrated circuit

Method and system for model-based design and layout of an integrated circuit

CADENCE DESIGN SYSTEMS INC

Method and system for model-based design and layout of an integrated circuit

LEE BRIAN

Methods, systems, and computer program product for implementing hotspot detection, repair, and optimization of an electronic circuit design