Inventor
KOPROWSKI TIMOTHY J
US16 patents
Patents
16 patentsUS6327685B1Dec 4, 2001
Logic built-in self test
IBM130 citations98
US6442723B1Aug 27, 2002
Logic built-in self test selective signature generation
IBM84 citations97
US6671838B1Dec 30, 2003
Method and apparatus for programmable LBIST channel weighting
IBM55 citations95
US6816990B2Nov 9, 2004
VLSI chip test power reduction
IBM21 citations92
US6442720B1Aug 27, 2002
Technique to decrease the exposure time of infrared imaging of semiconductor chips for failure analysis
IBM50 citations92
US6125465ASep 26, 2000
Isolation/removal of faults during LBIST testing
IBM29 citations92
US6708305B1Mar 16, 2004
Deterministic random LBIST
IBM29 citations90
US5479414ADec 26, 1995
Look ahead pattern generation and simulation including support for parallel fault simulation in LSSD/VLSI logic circuit testing
IBM36 citations86
US6968489B2Nov 22, 2005
Pseudo random optimized built-in self-test
IBM13 citations84
US6629281B1Sep 30, 2003
Method and system for at speed diagnostics and bit fail mapping
IBM10 citations73
US9389955B1Jul 12, 2016
String dataflow error detection
IBM3 citations72
US9292398B2Mar 22, 2016
Design-based weighting for logic built-in self-test
IBM4 citations71
US6629280B1Sep 30, 2003
Method and apparatus for delaying ABIST start
IBM3 citations62
US9715420B2Jul 25, 2017
String dataflow error detection
IBM0 citations51
US9588838B2Mar 7, 2017
String dataflow error detection
IBM0 citations51
US9292399B2Mar 22, 2016
Design-Based weighting for logic built-in self-test
IBM0 citations50