Inventor
SEKINE AKIHIKO
JP25 patents
⚠️ This page may combine multiple inventors who share the name “SEKINE AKIHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOPCON CORP
19 patentsUS6104481AAug 15, 2000
Surface inspection apparatus
TOPCON CORP113 citations95
US5912732AJun 15, 1999
Surface detecting apparatus
TOPCON CORP37 citations92
US5347328ASep 13, 1994
Apparatus for measuring an intraocular length between anterior and posterior portions of an eye
TOPCON CORP37 citations92
US5347327ASep 13, 1994
Process and apparatus for measuring axial eye length
TOPCON CORP32 citations92
US4968130ANov 6, 1990
Laser beam scanning type ophthalmological instrument
TOPCON CORP23 citations92
US5141302AAug 25, 1992
Intraocular length measuring instrument
TOPCON CORP54 citations91
US7379176B2May 27, 2008
Mask defect inspection apparatus
TOPCON CORP8 citations74
US6100970AAug 8, 2000
Apparatus for inspecting slight defects on a photomask pattern
TOPCON CORP6 citations74
US5812259ASep 22, 1998
Method and apparatus for inspecting slight defects in a photomask pattern
TOPCON CORP7 citations74
US5349399ASep 20, 1994
Intraocular length measuring instrument having phase compensating means
TOPCON CORP13 citations74
US5066116ANov 19, 1991
Optical system in a laser scanning eye fundus camera
TOPCON CORP11 citations74
US4933756AJun 12, 1990
Eye fundus camera
TOPCON CORP14 citations74
US7551273B2Jun 23, 2009
Mask defect inspection apparatus
TOPCON CORP2 citations63
US5088811AFeb 18, 1992
Laser beam scanning type eye fundus observing device
TOPCON CORP6 citations62
US7348585B2Mar 25, 2008
Surface inspection apparatus
TOPCON CORP4 citations61
US7245366B2Jul 17, 2007
Surface inspection method and surface inspection apparatus
TOPCON CORP3 citations61
US7154597B2Dec 26, 2006
Method for inspecting surface and apparatus for inspecting it
TOPCON CORP5 citations61
US5107106AApr 21, 1992
Scanning and detecting optical device
TOPCON CORP1 citations51
US7760349B2Jul 20, 2010
Mask-defect inspecting apparatus with movable focusing lens
TOPCON CORP0 citations42