Inventor · disambiguated record
Markus Seuring
Also filed as: SEURING MARKUS
7 granted patents·82 citations·filing 2004–2010
83Inventor score
Top patents by PatentIndex Score
7 records- 0188US7689884B2Multicore chip testADVANCED MICRO DEVICES INC·Filed 2007·Granted Mar 30, 2010·22 cites·18 claims
- 0284US7340658B2Technique for combining scan test and memory built-in self testADVANCED MICRO DEVICES INC·Filed 2004·Granted Mar 4, 2008·33 cites·35 claims
- 0380US7653845B2Test algorithm selection in memory built-in self test controllerADVANCED MICRO DEVICES INC·Filed 2006·Granted Jan 26, 2010·14 cites·15 claims
- 0478US7673208B2Storing multicore chip test dataADVANCED MICRO DEVICES INC·Filed 2007·Granted Mar 2, 2010·11 cites·20 claims
- 0561US9164726B2Apparatus for determining a number of successive equal bits preceding an edge within a bit stream and apparatus for reconstructing a repetitive bit sequenceRIVOIR JOCHEN·Filed 2010·Granted Oct 20, 2015·1 cites·24 claims
- 0657US9885752B2Test apparatus for generating reference scan chain test data and test systemSEURING MARKUS·Filed 2010·Granted Feb 6, 2018·1 cites·21 claims
- 0726US8307249B2At-speed bitmapping in a memory built-in self-test by locking an N-TH failureSEURING MARKUS·Filed 2010·Granted Nov 6, 2012·0 cites·23 claims
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