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Inventor
HYUN JI-HWAN
KR
2 patents
⚠️ This page may combine multiple inventors who share the name “HYUN JI-HWAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
1 patent
US9632126B2
Apr 25, 2017
Circuit of measuring leakage current in a semiconductor integrated circuit
SAMSUNG ELECTRONICS CO LTD
23 citations
86
PARK JAE-JIN
1 patent
US9048808B2
Jun 2, 2015
Sealed crystal oscillator and semiconductor package including the same
PARK JAE-JIN
0 citations
46