Inventor
OTA NORIHIRO
JP18 patents
⚠️ This page may combine multiple inventors who share the name “OTA NORIHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIDEC READ CORP
14 patentsUS10914758B2Feb 9, 2021
Inspection jig provided with probe, substrate inspection device provided with same, and method for manufacturing inspection jig
NIDEC READ CORP4 citations72
US10649004B2May 12, 2020
Contact terminal, inspection jig, and inspection apparatus
NIDEC READ CORP3 citations72
US10649005B2May 12, 2020
Contact terminal, inspection jig, and inspection device
NIDEC READ CORP4 citations72
US10877085B2Dec 29, 2020
Inspection jig and inspection device
NIDEC READ CORP2 citations66
US11415599B2Aug 16, 2022
Contact probe and electrical connection jig
NIDEC READ CORP0 citations62
US10656179B2May 19, 2020
Contact terminal, inspection jig, and inspection device
NIDEC READ CORP1 citations61
US10782317B2Sep 22, 2020
Contact probe
NIDEC READ CORP0 citations52
US12135336B2Nov 5, 2024
Contact, inspection jig, inspection device, and method of manufacturing contact
NIDEC READ CORP0 citations51
US12055562B2Aug 6, 2024
Contact terminal, inspection jig, and inspection apparatus
NIDEC READ CORP0 citations51
US12055561B2Aug 6, 2024
Contact terminal, inspection jig, and inspection device
NIDEC READ CORP0 citations51
US11327094B2May 10, 2022
Inspection jig, and inspection device including the same
NIDEC READ CORP0 citations51
US12013416B2Jun 18, 2024
Contact terminal, inspection jig, and inspection device
NIDEC READ CORP0 citations50
US11467186B2Oct 11, 2022
Inspection jig, inspection device, and contact terminal
NIDEC READ CORP0 citations41
US10877069B2Dec 29, 2020
Inspection jig, substrate inspection device, and method for manufacturing inspection jig
NIDEC READ CORP0 citations40
OMRON TATEISI ELECTRONICS CO
3 patentsUS4532632AJul 30, 1985
Tunable semiconductor laser
OMRON TATEISI ELECTRONICS CO23 citations82
US4491384AJan 1, 1985
Optical switch device
OMRON TATEISI ELECTRONICS CO20 citations82
US4595253AJun 17, 1986
Parallel-to-serial conversion of optical data using acousto-optical diffraction
OMRON TATEISI ELECTRONICS CO13 citations73