Inventor
TAYLOR MARK R
US13 patents
⚠️ This page may combine multiple inventors who share the name “TAYLOR MARK R”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
10 patentsUS7240266B2Jul 3, 2007
Clock control circuit for test that facilitates an at speed structural test
IBM23 citations91
US7466156B2Dec 16, 2008
System of digitally testing an analog driver circuit
IBM11 citations82
US7734968B2Jun 8, 2010
Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit)
IBM8 citations81
US7721170B2May 18, 2010
Apparatus and method for selectively implementing launch off scan capability in at speed testing
IBM7 citations73
US7308630B2Dec 11, 2007
Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit)
IBM8 citations71
US6882159B1Apr 19, 2005
Associated grouping of embedded cores for manufacturing test
IBM6 citations67
US7779375B2Aug 17, 2010
Design structure for shutting off data capture across asynchronous clock domains during at-speed testing
IBM5 citations62
US7685542B2Mar 23, 2010
Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testing
IBM4 citations62
US6804803B2Oct 12, 2004
Method for testing integrated logic circuits
IBM5 citations61
US7659740B2Feb 9, 2010
System and method of digitally testing an analog driver circuit
IBM0 citations50