Inventor
OOMINAMI Yuusuke
JP7 patents
Patents
7 patentsUS9812288B2Nov 7, 2017
Sample holder with light emitting and transferring elements for a charged particle beam apparatus
HITACHI HIGH TECH CORP2 citations71
US10134564B2Nov 20, 2018
Charged particle beam device
HITACHI HIGH TECH CORP3 citations68
US11239051B2Feb 1, 2022
Charged particle beam device
HITACHI HIGH TECH CORP4 citations67
US11561184B2Jan 24, 2023
Support system for specified inspection, support method for specified inspection, and non-transitory computer readable medium
HITACHI HIGH TECH CORP2 citations65
US12146846B2Nov 19, 2024
Cell analysis apparatus and cell analysis method
HITACHI HIGH TECH CORP0 citations51
US9875877B2Jan 23, 2018
Electron scanning microscope and image generation method
HITACHI HIGH TECH CORP0 citations49
US10141157B2Nov 27, 2018
Method for adjusting height of sample and observation system
HITACHI HIGH TECH CORP0 citations40