Inventor
OKAMOTO FUSATOSHI
JP9 patents
Patents
9 patentsUS10539583B2Jan 21, 2020
Substrate for sample analysis, sample analysis device, sample analysis system, and program for sample analysis system
PHC HOLDINGS CORP2 citations71
US10539582B2Jan 21, 2020
Substrate for sample analysis, sample analysis device, sample analysis system, and method for removing liquid from liquid that contains magnetic particles
PHC HOLDINGS CORP2 citations71
US10539560B2Jan 21, 2020
Substrate for sample analysis, and sample analysis apparatus
PHC HOLDINGS CORP1 citations60
US12066450B2Aug 20, 2024
Substrate for sample analysis
PHC HOLDINGS CORP1 citations57
US11874210B2Jan 16, 2024
Sample analysis substrate
PHC HOLDINGS CORP0 citations50
US11262356B2Mar 1, 2022
Specimen analysis substrate, specimen analysis device, specimen analysis system, and program for specimen analysis system
PHC HOLDINGS CORP0 citations50
US11169167B2Nov 9, 2021
Sample analysis substrate, sample analysis device, sample analysis system, and program for sample analysis
PHC HOLDINGS CORP0 citations50
US10520521B2Dec 31, 2019
Substrate for sample analysis, sample analysis device, sample analysis system, and program for sample analysis system
PHC HOLDINGS CORP0 citations39
US10309976B2Jun 4, 2019
Substrate for sample analysis, sample analysis device, sample analysis system, and program for sample analysis system
PHC HOLDINGS CORP0 citations39