Inventor

CHEN MING-CHUN

US21 patents

⚠️ This page may combine multiple inventors who share the name “CHEN MING-CHUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHEN MING-CHUN

ADVANCED MICRO DEVICES INC

Automatic recipe adjust and download based on process control window

Arrangement for improving defect scanner sensitivity and scanning defects on die of a semiconductor wafer

Dynamic process window control using simulated wet data from current and previous layer data

Intelligent usage of first pass defect data for improved statistical accuracy of wafer level classification

Automatic defect classification (ADC) reclassification engine

Method to accurately determine classification codes for defects during semiconductor manufacturing

Disposition tool for factory process control

Automatic defect reclassification of known propagator defects

Automatic defect classification individual defect predicate value retention

Semiconductor wafer optical scanning system and method using swath-area defect limitation

Critical area cost disposition feedback system

System for process data association using LaPlace Everett interpolation

Ion implantation feedback monitor using reverse process simulation tool

Intelligent adc reclassification of previously classified propagator defects

HUANG PETER

Capacitance modification without affecting die area

Adjusting capacitance of capacitors without affecting die area

Method for adjusting capacitance of capacitors without affecting die area

(unassigned)

Vehicle communication device

UNIV YUAN ZE

Silicon-on-insulator optical waveguide Michelson interferometer sensor for temperature monitoring

QISDA CORP

Method of controlling signal transmission in a local area network

INNOLUX CORP

Conductor structure and display device