Inventor
HROUZEK MICHAL
CZ5 patents
Patents
5 patentsUS9741527B2Aug 22, 2017
Specimen holder for a charged particle microscope
FEI CO3 citations62
US12228484B2Feb 18, 2025
Broad ion beam (BIB) systems for more efficient processing of multiple samples
FEI CO0 citations54
US12165833B2Dec 10, 2024
System and methods for automated processing of multiple samples in a BIB system
FEI CO0 citations54
US12106931B2Oct 1, 2024
Systems and methods for pre-aligning samples for more efficient processing of multiple samples with a Broad Ion Beam (BIB) system
FEI CO0 citations54
US10475629B2Nov 12, 2019
Charged-particle microscope with in situ deposition functionality
FEI CO0 citations42