Inventor

SHIRATSUCHI MASATAKA

JP41 patents

⚠️ This page may combine multiple inventors who share the name “SHIRATSUCHI MASATAKA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SHIRATSUCHI MASATAKA

TOSHIBA KK

Step difference detection apparatus and processing apparatus using the same

Optical element and optical device

Sheet thickness measuring device and image forming apparatus

Lighting system having lenses for light sources emitting rays at different wavelengths

Display device

Illumination device and light-guiding member

Inspection device, inspection method, and storage medium

Image sensor that includes a boundary region formed between a logic circuit region and an image-sensing element region and manufacturing method thereof

Illuminating device

Automatic focus adjusting mechanism and optical image acquisition apparatus

Fresnel lens and lighting apparatus provided with the Fresnel lens

Image sensor and manufacturing method thereof

Lighting apparatus

Image sensor including an image-sensing element region and logic circuit region and manufacturing method thereof

Light beam scanner

Microwave annealing apparatus and method of manufacturing a semiconductor device

LED lighting device

Projector and portable terminal

Discriminating apparatus

NUFLARE TECHNOLOGY INC

Multi-charged particle beam irradiation apparatus and multi-charged particle beam inspection apparatus

Inspection apparatus and inspection method

Inspection method and inspection apparatus

Charged particle beam inspection apparatus and charged particle beam inspection method

Multiple electron beam inspection apparatus and multiple electron beam inspection method

Pattern inspection method and pattern inspection apparatus

Multiple electron beam inspection apparatus and multiple electron beam inspection method

Pattern inspection apparatus and pattern inspection method

Electron beam inspection apparatus and electron beam inspection method

Pattern inspection apparatus and pattern inspection method

Electron beam inspection apparatus and electron beam inspection method

Pattern inspection apparatus and pattern inspection method

HAYASHIHARA HIROMICHI

Apparatus and method of determining the type of paper sheet, and image formation apparatus

Method and apparatus for deciding recording media based on light from a linear light source that passes a slit in a light shielding portion

TATSUTA SHINICHI

Optical information recording/reproducing apparatus and method

Optical information recording apparatus

MORINO TAKESHI

Surface light source device

MORIYAMA TAKAYOSHI

Lighting unit and lighting device

IKARI SEIJI

Illumination apparatus and image reading apparatus including the same

MOMONOI YOSHIHARU

Liquid crystal display and backlight module with tilting reflective surface

TOSHIBA MEMORY CORP

Thermal laser stimulation apparatus, method of thermally stimulating, and non-transitory computer readable medium

KATO MITSUAKI

Lighting apparatus with heat transfer and light guiding structure