Inventor · disambiguated record
Jim Mckenna
Also filed as: MCKENNA JIM
4 granted patents·39 citations·filing 2017–2017
72Inventor score
Technology areasG01R
Files withADVANCED TESTING TECH INC4
Top patents by PatentIndex Score
4 records- 0197US9739827B1Automated waveform analysis using a parallel automated development systemADVANCED TESTING TECH INC·Filed 2017·Granted Aug 22, 2017·26 cites·12 claims
- 0295US10151791B1Automated waveform analysis methods using a parallel automated development systemADVANCED TESTING TECH INC·Filed 2017·Granted Dec 11, 2018·12 cites·20 claims
- 0374US10598722B1Automated waveform analysis methods using a parallel automated development systemADVANCED TESTING TECH INC·Filed 2017·Granted Mar 24, 2020·1 cites·24 claims
- 0458US9864003B1Automated waveform analysis using a parallel automated development systemADVANCED TESTING TECH INC·Filed 2017·Granted Jan 9, 2018·0 cites·15 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →