Inventor
PARK SANG JINE
KR36 patents
⚠️ This page may combine multiple inventors who share the name “PARK SANG JINE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
23 patentsUS9947672B2Apr 17, 2018
Semiconductor devices including a dummy gate structure on a fin
SAMSUNG ELECTRONICS CO LTD4 citations84
US11664243B2May 30, 2023
Substrate processing apparatus
SAMSUNG ELECTRONICS CO LTD4 citations73
US10438891B2Oct 8, 2019
Integrated circuit device
SAMSUNG ELECTRONICS CO LTD2 citations73
US10096605B2Oct 9, 2018
Semiconductor devices including a dummy gate structure on a fin
SAMSUNG ELECTRONICS CO LTD3 citations73
US10985036B2Apr 20, 2021
Substrate processing apparatus and apparatus for manufacturing integrated circuit device
SAMSUNG ELECTRONICS CO LTD3 citations72
US10734380B2Aug 4, 2020
Semiconductor device and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD2 citations72
US10192973B2Jan 29, 2019
Methods of forming semiconductor devices including trench walls having multiple slopes
SAMSUNG ELECTRONICS CO LTD5 citations72
US10128246B2Nov 13, 2018
Semiconductor devices including an isolation layer on a fin and methods of forming semiconductor devices including an isolation layer on a fin
SAMSUNG ELECTRONICS CO LTD3 citations71
US9466697B2Oct 11, 2016
Semiconductor devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations63
US11887868B2Jan 30, 2024
Substrate processing apparatus and apparatus for manufacturing integrated circuit device
SAMSUNG ELECTRONICS CO LTD0 citations62
US10438799B2Oct 8, 2019
Methods of fabricating semiconductor devices including support patterns
SAMSUNG ELECTRONICS CO LTD1 citations62
US7923365B2Apr 12, 2011
Methods of forming field effect transistors having stress-inducing sidewall insulating spacers thereon
SAMSUNG ELECTRONICS CO LTD4 citations62
US7902082B2Mar 8, 2011
Method of forming field effect transistors using diluted hydrofluoric acid to remove sacrificial nitride spacers
SAMSUNG ELECTRONICS CO LTD5 citations60
US12468227B2Nov 11, 2025
Apparatus and method for processing substrate
SAMSUNG ELECTRONICS CO LTD0 citations52
US12322587B2Jun 3, 2025
Substrate drying apparatus and semiconductor device manufacturing method using same
SAMSUNG ELECTRONICS CO LTD0 citations52
US10446561B2Oct 15, 2019
Semiconductor devices including a dummy gate structure on a fin
SAMSUNG ELECTRONICS CO LTD0 citations52
US9985106B2May 29, 2018
Semiconductor devices utilizing spacer structures
SAMSUNG ELECTRONICS CO LTD0 citations52
US9613811B2Apr 4, 2017
Methods of manufacturing semiconductor devices
SAMSUNG ELECTRONICS CO LTD1 citations51
US9040415B2May 26, 2015
Semiconductor device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD1 citations51
US12588452B2Mar 24, 2026
Substrate processing apparatus and method thereof
SAMSUNG ELECTRONICS CO LTD0 citations50
US10297474B2May 21, 2019
Chemical supplier, processing apparatus including the chemical supplier
SAMSUNG ELECTRONICS CO LTD0 citations41
US10818522B2Oct 27, 2020
Process chamber for a supercritical process and apparatus for treating substrates having the same
SAMSUNG ELECTRONICS CO LTD0 citations40
US7585763B2Sep 8, 2009
Methods of fabricating integrated circuit devices using anti-reflective coating as implant blocking layer
SAMSUNG ELECTRONICS CO LTD0 citations39
PARK SANG-JINE
10 patentsUS9299700B2Mar 29, 2016
Semiconductor devices including a dummy gate structure on a fin
PARK SANG-JINE33 citations97
US9755079B2Sep 5, 2017
Semiconductor devices including insulating gates and methods for fabricating the same
PARK SANG-JINE13 citations83
US9548309B2Jan 17, 2017
Semiconductor devices including a dummy gate structure on a fin
PARK SANG-JINE10 citations83
US9443979B2Sep 13, 2016
Semiconductor devices including trench walls having multiple slopes
PARK SANG-JINE7 citations83
US8673724B2Mar 18, 2014
Methods of fabricating semiconductor devices
PARK SANG-JINE9 citations83
US9704864B2Jul 11, 2017
Semiconductor devices including an isolation layer on a fin and methods of forming semiconductor devices including an isolation layer on a fin
PARK SANG-JINE14 citations82
US8803248B2Aug 12, 2014
Semiconductor devices and methods of manufacturing the same
PARK SANG-JINE5 citations73
US9054210B2Jun 9, 2015
Method of fabricating semiconductor device
PARK SANG-JINE2 citations61
US8404580B2Mar 26, 2013
Methods for fabricating semiconductor devices
PARK SANG-JINE2 citations61
US8709942B2Apr 29, 2014
Methods for fabricating semiconductor devices
PARK SANG-JINE0 citations51