Inventor
KO YONG SUN
KR63 patents
⚠️ This page may combine multiple inventors who share the name “KO YONG SUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
48 patentsUS7271100B2Sep 18, 2007
Slurry composition, polishing method using the slurry composition and method of forming a gate pattern using the slurry composition
SAMSUNG ELECTRONICS CO LTD18 citations93
US6638855B1Oct 28, 2003
Method of filling contact hole of semiconductor device
SAMSUNG ELECTRONICS CO LTD73 citations93
US6889447B2May 10, 2005
Method for drying a wafer and apparatus for performing the same
SAMSUNG ELECTRONICS CO LTD29 citations92
US6802911B2Oct 12, 2004
Method for cleaning damaged layers and polymer residue from semiconductor device
SAMSUNG ELECTRONICS CO LTD22 citations92
US6399552B1Jun 4, 2002
Aqueous cleaning solution for removing contaminants surface of circuit substrate cleaning method using the same
SAMSUNG ELECTRONICS CO LTD40 citations92
US5855077AJan 5, 1999
Apparatus for drying semiconductor wafers using isopropyl alcohol
SAMSUNG ELECTRONICS CO LTD35 citations91
US6331478B1Dec 18, 2001
Methods for manufacturing semiconductor devices having chamfered metal silicide layers
SAMSUNG ELECTRONICS CO LTD25 citations89
US7667221B2Feb 23, 2010
Phase change memory devices and methods for fabricating the same
SAMSUNG ELECTRONICS CO LTD11 citations84
US7534726B2May 19, 2009
Method of forming a recess channel trench pattern, and fabricating a recess channel transistor
SAMSUNG ELECTRONICS CO LTD8 citations84
US7445997B2Nov 4, 2008
Methods of forming non-volatile memory devices having floating gate electrodes
SAMSUNG ELECTRONICS CO LTD10 citations84
US7205199B2Apr 17, 2007
Method of forming a recess channel trench pattern, and fabricating a recess channel transistor
SAMSUNG ELECTRONICS CO LTD10 citations84
US7156722B2Jan 2, 2007
Platen structure of polishing apparatus for processing semiconductor wafer and method for exchanging polishing pad affixed to the same
SAMSUNG ELECTRONICS CO LTD13 citations84
US7151043B2Dec 19, 2006
Method of manufacturing a semiconductor device
SAMSUNG ELECTRONICS CO LTD14 citations84
US10029332B2Jul 24, 2018
Spot heater and device for cleaning wafer using the same
SAMSUNG ELECTRONICS CO LTD6 citations83
US10418366B2Sep 17, 2019
Semiconductor devices including enlarged contact hole and methods of forming the same
SAMSUNG ELECTRONICS CO LTD7 citations82
US6369008B1Apr 9, 2002
Cleaning solutions for removing contaminants from the surfaces of semiconductor substrates and cleaning methods using the same
SAMSUNG ELECTRONICS CO LTD17 citations82
US6117350ASep 12, 2000
Adjustable selectivity etching solutions and methods of etching semiconductor devices using the same
SAMSUNG ELECTRONICS CO LTD9 citations74
US6080673AJun 27, 2000
Chemical mechanical polishing methods utilizing pH-adjusted polishing solutions
SAMSUNG ELECTRONICS CO LTD15 citations74
US11664243B2May 30, 2023
Substrate processing apparatus
SAMSUNG ELECTRONICS CO LTD4 citations73
US10438891B2Oct 8, 2019
Integrated circuit device
SAMSUNG ELECTRONICS CO LTD2 citations73
US6875706B2Apr 5, 2005
Cleaning solution and method of cleaning a semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD10 citations73
US10985036B2Apr 20, 2021
Substrate processing apparatus and apparatus for manufacturing integrated circuit device
SAMSUNG ELECTRONICS CO LTD3 citations72
US10576582B2Mar 3, 2020
Spot heater and device for cleaning wafer using the same
SAMSUNG ELECTRONICS CO LTD2 citations72
US10916549B2Feb 9, 2021
Semiconductor devices including enlarged contact hole and methods of forming the same
SAMSUNG ELECTRONICS CO LTD4 citations71
US6838330B2Jan 4, 2005
Method of forming a contact hole of a semiconductor device
SAMSUNG ELECTRONICS CO LTD9 citations66
US7781346B2Aug 24, 2010
Methods of forming patterns and capacitors for semiconductor devices using the same
SAMSUNG ELECTRONICS CO LTD2 citations63
US7713879B2May 11, 2010
Chemical mechanical polishing method
SAMSUNG ELECTRONICS CO LTD2 citations63
US7338610B2Mar 4, 2008
Etching method for manufacturing semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations63
US7144301B2Dec 5, 2006
Method and system for planarizing integrated circuit material
SAMSUNG ELECTRONICS CO LTD2 citations63
US7091117B2Aug 15, 2006
Method of fabricating a semiconductor device
SAMSUNG ELECTRONICS CO LTD5 citations63
US11887868B2Jan 30, 2024
Substrate processing apparatus and apparatus for manufacturing integrated circuit device
SAMSUNG ELECTRONICS CO LTD0 citations62
US10438799B2Oct 8, 2019
Methods of fabricating semiconductor devices including support patterns
SAMSUNG ELECTRONICS CO LTD1 citations62
US8053751B2Nov 8, 2011
Phase-change semiconductor device and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD3 citations62
US7745341B2Jun 29, 2010
Phase-change semiconductor device and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations62
US7589013B2Sep 15, 2009
Electrode structure and method of manufacturing the same, phase-change memory device having the electrode structure and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD4 citations62
US7452773B2Nov 18, 2008
Method of manufacturing a flash memory device
SAMSUNG ELECTRONICS CO LTD5 citations62
US7025493B2Apr 11, 2006
Chemical supply system and chemical mixing apparatus
SAMSUNG ELECTRONICS CO LTD2 citations62
US11361960B2Jun 14, 2022
Substrate processing apparatus and substrate processing system including the same
SAMSUNG ELECTRONICS CO LTD0 citations61
US11329053B2May 10, 2022
Semiconductor devices including enlarged contact hole and methods of forming the same
SAMSUNG ELECTRONICS CO LTD0 citations61
US10910237B2Feb 2, 2021
Operating method for wet etching system and related system
SAMSUNG ELECTRONICS CO LTD1 citations61
US7534704B2May 19, 2009
Thin layer structure and method of forming the same
SAMSUNG ELECTRONICS CO LTD5 citations61
US6831012B2Dec 14, 2004
Method for forming a silicide film of a semiconductor device
SAMSUNG ELECTRONICS CO LTD5 citations61
US7709319B2May 4, 2010
Semiconductor device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations60
US9985106B2May 29, 2018
Semiconductor devices utilizing spacer structures
SAMSUNG ELECTRONICS CO LTD0 citations52
US9394509B2Jul 19, 2016
Cleaning solution composition and method of cleaning semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US8048809B2Nov 1, 2011
Polishing method using chemical mechanical slurry composition
SAMSUNG ELECTRONICS CO LTD1 citations52
US7579284B2Aug 25, 2009
Etching solution, method of forming a pattern using the same, method of manufacturing a multiple gate oxide layer using the same and method of manufacturing a flash memory device using the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US7498253B2Mar 3, 2009
Local interconnection method and structure for use in semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations52
KIM DONG-KEUN
1 patentBAEK KYOUNG-YUN
1 patentShowing the top 50 of 63 patents by PatentIndex Score.