Inventor
OTTO JOHANN
DE11 patents
Patents
11 patentsUS4963823AOct 16, 1990
Electron beam measuring instrument
SIEMENS AG24 citations92
US4241259ADec 23, 1980
Scanning electron microscope
SIEMENS AG32 citations91
US4902966AFeb 20, 1990
Method and apparatus for operating a scanning microscope
SIEMENS AG10 citations73
US4812748AMar 14, 1989
Method and apparatus for operating a scanning microscope
SIEMENS AG15 citations73
US4689555AAug 25, 1987
Method for the determination of points on a specimen carrying a specific signal frequency by use of a scanning microscope
SIEMENS AG10 citations73
US4677351AJun 30, 1987
Circuit for preventing burn-in spots on the picture screen of a visual display
SIEMENS AG9 citations73
US4611119ASep 9, 1986
Method of emphasizing a subject area in a scanning microscope
SIEMENS AG7 citations73
US4640626AFeb 3, 1987
Method and apparatus for localizing weak points within an electrical circuit
SIEMENS AG11 citations69
US4471302ASep 11, 1984
Method for representing logical status changes of a plurality of adjacent circuit nodes in an integrated circuit in a logic image employing a pulsed electron probe
SIEMENS AG5 citations62
US7508290B2Mar 24, 2009
Inductive component and use of said component
SIEMENS AG2 citations60
US4780669AOct 25, 1988
Method and arrangement for evaluating a test voltage by means of a bandwidth-limited evaluation circuit
SIEMENS AG2 citations60