Inventor · disambiguated record
Craig Nishizaki
Also filed as: NISHIZAKI CRAIG · NISHIZAKI CRAIG M
3 granted patents·1 pending application·66 citations·filing 1997–2013
64Inventor score
Top patents by PatentIndex Score
4 records- 0176US6018686AElectrically imprinting a semiconductor die with identifying informationCYPRESS SEMICONDUCTOR CORP·Filed 1997·Granted Jan 25, 2000·65 cites·16 claims
- 0255US9007079B2System and method for compensating measured IDDQ valuesNVIDIA CORP·Filed 2012·Granted Apr 14, 2015·1 cites·20 claims
- 0343US9207277B2System and method for generating a yield forecast based on wafer acceptance testsNVIDIA CORP·Filed 2012·Granted Dec 8, 2015·0 cites·20 claims
- 0436US2014358478A1Multivariate yield calculator for wafer integrated circuit fabrication and method of use thereofNVIDIA CORP·Filed 2013·Application pending·0 cites
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