Inventor
LEE JUNG-HYEON
KR19 patents
⚠️ This page may combine multiple inventors who share the name “LEE JUNG-HYEON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
18 patentsUS6885052B2Apr 26, 2005
Semiconductor memory device having self-aligned contacts and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD17 citations92
US6381165B1Apr 30, 2002
Semiconductor memory device having storage node electrodes offset from each other
SAMSUNG ELECTRONICS CO LTD30 citations92
US7892982B2Feb 22, 2011
Method for forming fine patterns of a semiconductor device using a double patterning process
SAMSUNG ELECTRONICS CO LTD19 citations84
US7064051B2Jun 20, 2006
Method of forming self-aligned contact pads of non-straight type semiconductor memory device
SAMSUNG ELECTRONICS CO LTD11 citations83
US6893779B2May 17, 2005
Phase shifting mask for manufacturing semiconductor device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD13 citations83
US6716746B1Apr 6, 2004
Semiconductor device having self-aligned contact and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD16 citations83
US7205241B2Apr 17, 2007
Method for manufacturing semiconductor device with contact body extended in direction of bit line
SAMSUNG ELECTRONICS CO LTD8 citations73
US7132708B2Nov 7, 2006
Semiconductor memory device having self-aligned contacts and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD6 citations73
US8778598B2Jul 15, 2014
Method of forming fine patterns of semiconductor device by using double patterning process which uses acid diffusion
SAMSUNG ELECTRONICS CO LTD3 citations62
US7449383B2Nov 11, 2008
Method of manufacturing a capacitor and method of manufacturing a dynamic random access memory device using the same
SAMSUNG ELECTRONICS CO LTD4 citations62
US7375390B2May 20, 2008
Semiconductor memory device having high electrical performance and mask and photolithography friendliness
SAMSUNG ELECTRONICS CO LTD3 citations62
US7176512B2Feb 13, 2007
Semiconductor memory device having high electrical performance and mask and photolithography friendliness
SAMSUNG ELECTRONICS CO LTD4 citations62
US6492701B1Dec 10, 2002
Semiconductor device having anti-reflective cap and spacer, method of manufacturing the same, and method of manufacturing photoresist pattern using the same
SAMSUNG ELECTRONICS CO LTD5 citations62
US6218204B1Apr 17, 2001
Capacitance compensation for topological measurements in a semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations59
US7670761B2Mar 2, 2010
Method of forming a fine pattern of a semiconductor device using a resist reflow measurement key
SAMSUNG ELECTRONICS CO LTD0 citations52
US7473497B2Jan 6, 2009
Phase shifting mask for manufacturing semiconductor device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations51
US7221014B2May 22, 2007
DRAM devices having an increased density layout
SAMSUNG ELECTRONICS CO LTD1 citations51
US7457058B2Nov 25, 2008
Optical element holder and projection exposure apparatus having the same
SAMSUNG ELECTRONICS CO LTD1 citations50