Inventor
STEINERT JOERG
DE20 patents
⚠️ This page may combine multiple inventors who share the name “STEINERT JOERG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ZEISS CARL MICROIMAGING GMBH
12 patentsUS7561326B2Jul 14, 2009
Light scanning microscope and use
ZEISS CARL MICROIMAGING GMBH27 citations91
US7852474B2Dec 14, 2010
Spectral analysis unit with a diffraction grating
ZEISS CARL MICROIMAGING GMBH8 citations83
US7554664B2Jun 30, 2009
Laser scanning microscope
ZEISS CARL MICROIMAGING GMBH9 citations83
US7692879B2Apr 6, 2010
Correction device for an optical arrangement and confocal microscope with such a device
ZEISS CARL MICROIMAGING GMBH9 citations82
US7888628B2Feb 15, 2011
Optical zoom system for a light scanning microscope
ZEISS CARL MICROIMAGING GMBH2 citations62
US7796149B2Sep 14, 2010
Method for scanner control in at least one scan axis in a laser scanning microscope
ZEISS CARL MICROIMAGING GMBH2 citations62
US7679045B2Mar 16, 2010
Method for correcting a control of an optical scanner in a device for imaging a sample by scanning and the device for performing the method
ZEISS CARL MICROIMAGING GMBH4 citations62
US7649683B2Jan 19, 2010
Process for the observation of at least one sample region with a light raster microscope with linear sampling
ZEISS CARL MICROIMAGING GMBH2 citations61
US7459698B2Dec 2, 2008
Process for the observation of at least one sample region with a light raster microscope
ZEISS CARL MICROIMAGING GMBH5 citations61
US8013288B2Sep 6, 2011
Method for correcting a control of an optical scanner and the optical scanner
ZEISS CARL MICROIMAGING GMBH1 citations50
US7933083B2Apr 26, 2011
Diaphragm device
ZEISS CARL MICROIMAGING GMBH0 citations49
US7706090B2Apr 27, 2010
Diaphragm device
ZEISS CARL MICROIMAGING GMBH0 citations49
ZEISS CARL JENA GMBH
3 patentsUS7488931B2Feb 10, 2009
Optical zoom system for a light scanning electron microscope
ZEISS CARL JENA GMBH8 citations83
US7369305B2May 6, 2008
Optical zoom system for a light scanning electron microscope
ZEISS CARL JENA GMBH12 citations83
US7271382B2Sep 18, 2007
Process for the observation of at least one sample region with a light raster microscope with light distribution in the form of a point
ZEISS CARL JENA GMBH9 citations72