P

Inventor

QI YI

US54 patents
⚠️ This page may combine multiple inventors who share the name “QI YI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

GLOBALFOUNDRIES INC

39 patents
US10249538B1Apr 2, 2019

Method of forming vertical field effect transistors with different gate lengths and a resulting structure

GLOBALFOUNDRIES INC22 citations94
US10217846B1Feb 26, 2019

Vertical field effect transistor formation with critical dimension control

GLOBALFOUNDRIES INC21 citations94
US10170473B1Jan 1, 2019

Forming long channel FinFET with short channel vertical FinFET and related integrated circuit

GLOBALFOUNDRIES INC20 citations94
US10163635B1Dec 25, 2018

Asymmetric spacer for preventing epitaxial merge between adjacent devices of a semiconductor and related method

GLOBALFOUNDRIES INC26 citations94
US10446483B2Oct 15, 2019

Metal-insulator-metal capacitors with enlarged contact areas

GLOBALFOUNDRIES INC12 citations84
US10068810B1Sep 4, 2018

Multiple Fin heights with dielectric isolation

GLOBALFOUNDRIES INC9 citations84
US9887094B1Feb 6, 2018

Methods of forming EPI semiconductor material on the source/drain regions of a FinFET device

GLOBALFOUNDRIES INC14 citations84
US9524908B2Dec 20, 2016

Methods of removing portions of fins by preforming a selectively etchable material in the substrate

GLOBALFOUNDRIES INC11 citations84
US9431539B2Aug 30, 2016

Dual-strained nanowire and FinFET devices with dielectric isolation

GLOBALFOUNDRIES INC11 citations84
US9397200B2Jul 19, 2016

Methods of forming 3D devices with dielectric isolation and a strained channel region

GLOBALFOUNDRIES INC12 citations84
US9123627B1Sep 1, 2015

Methods of forming alternative material fins with reduced defect density for a FinFET semiconductor device

GLOBALFOUNDRIES INC17 citations84
US10211147B2Feb 19, 2019

Metal-insulator-metal capacitors with dielectric inner spacers

GLOBALFOUNDRIES INC11 citations83
US10559656B2Feb 11, 2020

Wrap-all-around contact for nanosheet-FET and method of forming same

GLOBALFOUNDRIES INC8 citations82
US10381459B2Aug 13, 2019

Transistors with H-shaped or U-shaped channels and method for forming the same

GLOBALFOUNDRIES INC6 citations73
US10068902B1Sep 4, 2018

Integrated circuit structure incorporating non-planar field effect transistors with different channel region heights and method

GLOBALFOUNDRIES INC4 citations73
US10050125B1Aug 14, 2018

Vertical-transport field-effect transistors with an etched-through source/drain cavity

GLOBALFOUNDRIES INC6 citations73
US9837268B2Dec 5, 2017

Raised fin structures and methods of fabrication

GLOBALFOUNDRIES INC3 citations73
US9391140B2Jul 12, 2016

Raised fin structures and methods of fabrication

GLOBALFOUNDRIES INC3 citations73
US9224605B2Dec 29, 2015

Forming alternative material fins with reduced defect density by performing an implantation/anneal defect generation process

GLOBALFOUNDRIES INC5 citations73
US9478663B2Oct 25, 2016

FinFET device including a uniform silicon alloy fin

GLOBALFOUNDRIES INC5 citations71
US10756184B2Aug 25, 2020

Faceted epitaxial source/drain regions

GLOBALFOUNDRIES INC3 citations69
US10410929B2Sep 10, 2019

Multiple gate length device with self-aligned top junction

GLOBALFOUNDRIES INC1 citations62
US10276689B2Apr 30, 2019

Method of forming a vertical field effect transistor (VFET) and a VFET structure

GLOBALFOUNDRIES INC1 citations62
US10262903B2Apr 16, 2019

Boundary spacer structure and integration

GLOBALFOUNDRIES INC1 citations62
US10211317B1Feb 19, 2019

Vertical-transport field-effect transistors with an etched-through source/drain cavity

GLOBALFOUNDRIES INC1 citations62
US8916442B2Dec 23, 2014

Method of forming step doping channel profile for super steep retrograde well field effect transistor and resulting device

GLOBALFOUNDRIES INC2 citations60
US10297675B1May 21, 2019

Dual-curvature cavity for epitaxial semiconductor growth

GLOBALFOUNDRIES INC1 citations58
US10643845B2May 5, 2020

Repaired mask structures and resultant underlying patterned structures

GLOBALFOUNDRIES INC0 citations52
US10121868B1Nov 6, 2018

Methods of forming epi semiconductor material on a thinned fin in the source/drain regions of a FinFET device

GLOBALFOUNDRIES INC1 citations52
US10700173B2Jun 30, 2020

FinFET device with a wrap-around silicide source/drain contact structure

GLOBALFOUNDRIES INC0 citations51
US10680065B2Jun 9, 2020

Field-effect transistors with a grown silicon-germanium channel

GLOBALFOUNDRIES INC0 citations51
US10636894B2Apr 28, 2020

Fin-type transistors with spacers on the gates

GLOBALFOUNDRIES INC0 citations51
US10546775B1Jan 28, 2020

Field-effect transistors with improved dielectric gap fill

GLOBALFOUNDRIES INC0 citations51
US9362357B2Jun 7, 2016

Blanket EPI super steep retrograde well formation without Si recess

GLOBALFOUNDRIES INC0 citations50
US10483172B2Nov 19, 2019

Transistor device structures with retrograde wells in CMOS applications

GLOBALFOUNDRIES INC0 citations49
US10355104B2Jul 16, 2019

Single-curvature cavity for semiconductor epitaxy

GLOBALFOUNDRIES INC0 citations49
US9852954B2Dec 26, 2017

Methods of forming transistors with retrograde wells in CMOS applications and the resulting device structures

GLOBALFOUNDRIES INC0 citations49
US9209181B2Dec 8, 2015

Methods of forming transistors with retrograde wells in CMOS applications and the resulting device structures

GLOBALFOUNDRIES INC0 citations49
US9099380B2Aug 4, 2015

Method of forming step doping channel profile for super steep retrograde well field effect transistor and resulting device

GLOBALFOUNDRIES INC0 citations49

IBM

7 patents

MCALPINE MICHAEL C

1 patent

HUANG SHENG

1 patent

KANG LAEGU

1 patent

NAT UNIV SINGAPORE

1 patent

Showing the top 50 of 54 patents by PatentIndex Score.