P

Inventor

BINNARD MICHAEL

US50 patents
⚠️ This page may combine multiple inventors who share the name “BINNARD MICHAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NIKON CORP

42 patents
US7545479B2Jun 9, 2009

Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine

NIKON CORP58 citations99
US7372538B2May 13, 2008

Apparatus and method for maintaining immerison fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine

NIKON CORP107 citations99
US7327435B2Feb 5, 2008

Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine

NIKON CORP75 citations99
US6452292B1Sep 17, 2002

Planar motor with linear coil arrays

NIKON CORP193 citations99
US6445093B1Sep 3, 2002

Planar motor with linear coil arrays

NIKON CORP202 citations99
US6678038B2Jan 13, 2004

Apparatus and methods for detecting tool-induced shift in microlithography apparatus

NIKON CORP65 citations96
US6788385B2Sep 7, 2004

Stage device, exposure apparatus and method

NIKON CORP82 citations95
US6927505B2Aug 9, 2005

Following stage planar motor

NIKON CORP27 citations93
US6750625B2Jun 15, 2004

Wafer stage with magnetic bearings

NIKON CORP38 citations93
US6686991B1Feb 3, 2004

Wafer stage assembly, servo control system, and method for operating the same

NIKON CORP44 citations92
US6590639B1Jul 8, 2003

Active vibration isolation system having pressure control

NIKON CORP35 citations92
US6523695B1Feb 25, 2003

Method and apparatus for operating a vibration isolation system having electronic and pneumatic control systems

NIKON CORP27 citations92
US6504162B1Jan 7, 2003

Stage device, control system, and method for stabilizing wafer stage and wafer table

NIKON CORP31 citations92
US10254654B2Apr 9, 2019

Microelectromechanical mirror assembly

NIKON CORP6 citations84
US6956308B2Oct 18, 2005

Dual flow circulation system for a mover

NIKON CORP14 citations84
US6844694B2Jan 18, 2005

Stage assembly and exposure apparatus including the same

NIKON CORP16 citations84
US6758313B2Jul 6, 2004

Method and apparatus for operating a vibration isolation system having electronic and pneumatic control systems

NIKON CORP14 citations84
US6551045B2Apr 22, 2003

Wafer stage chamber

NIKON CORP14 citations84
US7417714B2Aug 26, 2008

Stage assembly with measurement system initialization, vibration compensation, low transmissibility, and lightweight fine stage

NIKON CORP10 citations82
US6987558B2Jan 17, 2006

Reaction mass for a stage device

NIKON CORP8 citations74
US6842226B2Jan 11, 2005

Flexure supported wafer table

NIKON CORP9 citations74
US6639654B2Oct 28, 2003

Wafer stage carrier and removal assembly

NIKON CORP11 citations74
US6979920B2Dec 27, 2005

Circulation housing for a mover

NIKON CORP10 citations70
US9726987B2Aug 8, 2017

Positioning system using surface pattern recognition and interpolation

NIKON CORP4 citations69
US9946163B2Apr 17, 2018

Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine

NIKON CORP0 citations63
US9500960B2Nov 22, 2016

Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine

NIKON CORP0 citations63
US9329493B2May 3, 2016

Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine

NIKON CORP0 citations63
US8848166B2Sep 30, 2014

Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine

NIKON CORP0 citations63
US8634057B2Jan 21, 2014

Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine

NIKON CORP1 citations63
US8610875B2Dec 17, 2013

Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine

NIKON CORP0 citations63
US8351019B2Jan 8, 2013

Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine

NIKON CORP0 citations63
US8035795B2Oct 11, 2011

Apparatus and method for maintaining immersion fluid in the gap under the protection lens during wafer exchange in an immersion lithography machine

NIKON CORP0 citations63
US7830046B2Nov 9, 2010

Damper for a stage assembly

NIKON CORP2 citations63
US7414336B2Aug 19, 2008

Dual flow circulation system for a mover

NIKON CORP3 citations63
US6734947B2May 11, 2004

Quick chamber seals

NIKON CORP5 citations63
US6570644B2May 27, 2003

Connection assembly of wafer stage chamber

NIKON CORP6 citations61
US7869000B2Jan 11, 2011

Stage assembly with lightweight fine stage and low transmissibility

NIKON CORP2 citations60
US10884344B2Jan 5, 2021

Positioning system using surface pattern recognition and interpolation

NIKON CORP0 citations59
US6963821B2Nov 8, 2005

Stage counter mass system

NIKON CORP0 citations52
US10084364B2Sep 25, 2018

Power minimizing controller for a stage assembly

NIKON CORP0 citations50
US9921495B2Mar 20, 2018

Magnetic sensor calibration and servo for planar motor stage

NIKON CORP0 citations45
US7429845B2Sep 30, 2008

System and method for controlling a stage assembly

NIKON CORP0 citations42

BINNARD MICHAEL

7 patents

NIPPON KOGAKU KK

1 patent