Inventor
BINNARD MICHAEL
US50 patents
⚠️ This page may combine multiple inventors who share the name “BINNARD MICHAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIKON CORP
42 patentsUS7545479B2Jun 9, 2009
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
NIKON CORP58 citations99
US7372538B2May 13, 2008
Apparatus and method for maintaining immerison fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
NIKON CORP107 citations99
US7327435B2Feb 5, 2008
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
NIKON CORP75 citations99
US6452292B1Sep 17, 2002
Planar motor with linear coil arrays
NIKON CORP193 citations99
US6445093B1Sep 3, 2002
Planar motor with linear coil arrays
NIKON CORP202 citations99
US6678038B2Jan 13, 2004
Apparatus and methods for detecting tool-induced shift in microlithography apparatus
NIKON CORP65 citations96
US6788385B2Sep 7, 2004
Stage device, exposure apparatus and method
NIKON CORP82 citations95
US6927505B2Aug 9, 2005
Following stage planar motor
NIKON CORP27 citations93
US6750625B2Jun 15, 2004
Wafer stage with magnetic bearings
NIKON CORP38 citations93
US6686991B1Feb 3, 2004
Wafer stage assembly, servo control system, and method for operating the same
NIKON CORP44 citations92
US6590639B1Jul 8, 2003
Active vibration isolation system having pressure control
NIKON CORP35 citations92
US6523695B1Feb 25, 2003
Method and apparatus for operating a vibration isolation system having electronic and pneumatic control systems
NIKON CORP27 citations92
US6504162B1Jan 7, 2003
Stage device, control system, and method for stabilizing wafer stage and wafer table
NIKON CORP31 citations92
US10254654B2Apr 9, 2019
Microelectromechanical mirror assembly
NIKON CORP6 citations84
US6956308B2Oct 18, 2005
Dual flow circulation system for a mover
NIKON CORP14 citations84
US6844694B2Jan 18, 2005
Stage assembly and exposure apparatus including the same
NIKON CORP16 citations84
US6758313B2Jul 6, 2004
Method and apparatus for operating a vibration isolation system having electronic and pneumatic control systems
NIKON CORP14 citations84
US6551045B2Apr 22, 2003
Wafer stage chamber
NIKON CORP14 citations84
US7417714B2Aug 26, 2008
Stage assembly with measurement system initialization, vibration compensation, low transmissibility, and lightweight fine stage
NIKON CORP10 citations82
US6987558B2Jan 17, 2006
Reaction mass for a stage device
NIKON CORP8 citations74
US6842226B2Jan 11, 2005
Flexure supported wafer table
NIKON CORP9 citations74
US6639654B2Oct 28, 2003
Wafer stage carrier and removal assembly
NIKON CORP11 citations74
US6979920B2Dec 27, 2005
Circulation housing for a mover
NIKON CORP10 citations70
US9726987B2Aug 8, 2017
Positioning system using surface pattern recognition and interpolation
NIKON CORP4 citations69
US9946163B2Apr 17, 2018
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
NIKON CORP0 citations63
US9500960B2Nov 22, 2016
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
NIKON CORP0 citations63
US9329493B2May 3, 2016
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
NIKON CORP0 citations63
US8848166B2Sep 30, 2014
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
NIKON CORP0 citations63
US8634057B2Jan 21, 2014
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
NIKON CORP1 citations63
US8610875B2Dec 17, 2013
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
NIKON CORP0 citations63
US8351019B2Jan 8, 2013
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
NIKON CORP0 citations63
US8035795B2Oct 11, 2011
Apparatus and method for maintaining immersion fluid in the gap under the protection lens during wafer exchange in an immersion lithography machine
NIKON CORP0 citations63
US7830046B2Nov 9, 2010
Damper for a stage assembly
NIKON CORP2 citations63
US7414336B2Aug 19, 2008
Dual flow circulation system for a mover
NIKON CORP3 citations63
US6734947B2May 11, 2004
Quick chamber seals
NIKON CORP5 citations63
US6570644B2May 27, 2003
Connection assembly of wafer stage chamber
NIKON CORP6 citations61
US7869000B2Jan 11, 2011
Stage assembly with lightweight fine stage and low transmissibility
NIKON CORP2 citations60
US10884344B2Jan 5, 2021
Positioning system using surface pattern recognition and interpolation
NIKON CORP0 citations59
US6963821B2Nov 8, 2005
Stage counter mass system
NIKON CORP0 citations52
US10084364B2Sep 25, 2018
Power minimizing controller for a stage assembly
NIKON CORP0 citations50
US9921495B2Mar 20, 2018
Magnetic sensor calibration and servo for planar motor stage
NIKON CORP0 citations45
US7429845B2Sep 30, 2008
System and method for controlling a stage assembly
NIKON CORP0 citations42
BINNARD MICHAEL
7 patentsUS8488100B2Jul 16, 2013
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
BINNARD MICHAEL6 citations92
US8514367B2Aug 20, 2013
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
BINNARD MICHAEL3 citations73
US8269944B2Sep 18, 2012
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
BINNARD MICHAEL2 citations73
US9081298B2Jul 14, 2015
Apparatus for maintaining immersion fluid in the gap under the projection lens during wafer exchange using a co-planar member in an immersion lithography machine
BINNARD MICHAEL0 citations62
US8879047B2Nov 4, 2014
Apparatus and method for maintaining immersion fluid in the gap under the projection lens using a pad member or second stage during wafer exchange in an immersion lithography machine
BINNARD MICHAEL0 citations62
US8848168B2Sep 30, 2014
Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
BINNARD MICHAEL0 citations62
US8582080B2Nov 12, 2013
Stage assembly with measurement system initialization, vibration compensation, low transmissibility, and lightweight fine stage
BINNARD MICHAEL2 citations60