Inventor

KUKREJA HIMANSHU

SG6 patents

⚠️ This page may combine multiple inventors who share the name “KUKREJA HIMANSHU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KUKREJA HIMANSHU

2 patents

US8832510B2Sep 9, 2014

Circuit to reduce peak power during transition fault testing of integrated circuit

KUKREJA HIMANSHU2 citations54

US8504886B2Aug 6, 2013

Method for partitioning scan chain

KUKREJA HIMANSHU0 citations33

JAIN SIDDHARTHA

1 patent

US8689068B2Apr 1, 2014

Low leakage current operation of integrated circuit using scan chain

JAIN SIDDHARTHA6 citations68

MAXLINEAR INC

1 patent

US11047909B2Jun 29, 2021

Inter-domain power element testing using scan

MAXLINEAR INC1 citations58

LANTIQ BETEILIGUNGS GMBH & CO KG

1 patent

US10120026B2Nov 6, 2018

On-chip test pattern generation

LANTIQ BETEILIGUNGS GMBH & CO KG1 citations47

INTEL CORP

1 patent

US10032723B2Jul 24, 2018

Metal layer independent version identifier

INTEL CORP1 citations38