Inventor
ROSE HARALD
DE32 patents
⚠️ This page may combine multiple inventors who share the name “ROSE HARALD”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CEOS GMBH
7 patentsUS7807965B2Oct 5, 2010
Corrector for axial and off-axial beam paths
CEOS GMBH14 citations83
US6888145B2May 3, 2005
Optical particle corrector
CEOS GMBH11 citations73
US6797962B1Sep 28, 2004
Electrostatic corrector for eliminating the chromatic aberration of particle lenses
CEOS GMBH10 citations68
US7989776B2Aug 2, 2011
Corrective for eliminating the third-order aperture aberration and the first-order, first-degree axial, chromatic aberration
CEOS GMBH6 citations62
US6774372B1Aug 10, 2004
Electron-optical lens arrangement with an axis that can be largely displaced
CEOS GMBH5 citations62
US6836372B2Dec 28, 2004
Electrostatic corrector
CEOS GMBH3 citations56
US7973289B2Jul 5, 2011
Method for producing image contrast by phase shifting in electron optics
CEOS GMBH0 citations41
ZEISS STIFTUNG
5 patentsUS5449914ASep 12, 1995
Imaging electron energy filter
ZEISS STIFTUNG53 citations96
US5319207AJun 7, 1994
Imaging system for charged particles
ZEISS STIFTUNG64 citations96
US4962313AOct 9, 1990
Wien-type imaging corrector for an electron microscope
ZEISS STIFTUNG87 citations96
US4740704AApr 26, 1988
Omega-type electron energy filter
ZEISS STIFTUNG49 citations92
US4760261AJul 26, 1988
Alpha-type electron energy filter
ZEISS STIFTUNG23 citations82
PHILIPS CORP
4 patentsUS5084622AJan 28, 1992
Correction system for a charged-particle beam apparatus
PHILIPS CORP55 citations96
US5336885AAug 9, 1994
Electron beam apparatus
PHILIPS CORP24 citations92
US5126565AJun 30, 1992
Energy filter for charged particle beam apparatus
PHILIPS CORP41 citations92
US5448063ASep 5, 1995
Energy filter with correction of a second-order chromatic aberration
PHILIPS CORP35 citations90
SIEMENS AG
4 patentsUS4896036AJan 23, 1990
Detector objective for scanning microscopes
SIEMENS AG41 citations92
US4853545AAug 1, 1989
Particle beam apparatus for low-error imaging of line-shaped subjects
SIEMENS AG36 citations92
US4714833ADec 22, 1987
Arrangement for detecting secondary and/or backscatter electrons in an electron beam apparatus
SIEMENS AG37 citations92
US4980558ADec 25, 1990
Electron beam generator
SIEMENS AG5 citations62
ZEISS CARL NTS GMBH
3 patentsUS7321124B2Jan 22, 2008
Corrector for correcting first-order chromatic aberrations of the first degree
ZEISS CARL NTS GMBH20 citations92
US6861651B2Mar 1, 2005
Electron-optical corrector for eliminating third-order aberations
ZEISS CARL NTS GMBH12 citations84
US7902506B2Mar 8, 2011
Phase-shifting element and particle beam device having a phase-shifting element
ZEISS CARL NTS GMBH10 citations81
LEO ELEKTRONENMIKROSKOPIE GMBH
3 patentsUS7012262B2Mar 14, 2006
Corrector for correcting first-order chromatic aberrations of the first degree
LEO ELEKTRONENMIKROSKOPIE GMBH25 citations92
US6784437B2Aug 31, 2004
Corrector for correcting first-order chromatic aberrations of the first degree
LEO ELEKTRONENMIKROSKOPIE GMBH21 citations92
US6855939B2Feb 15, 2005
Particle beam system having a mirror corrector
LEO ELEKTRONENMIKROSKOPIE GMBH21 citations88