Inventor
WELLS ROBERT W
US25 patents
Patents
25 patentsUS5673198ASep 30, 1997
Concurrent electronic circuit design and implementation
XILINX INC172 citations99
US6219305B1Apr 17, 2001
Method and system for measuring signal propagation delays using ring oscillators
XILINX INC91 citations98
US6023565AFeb 8, 2000
Method for configuring circuits over a data communications link
XILINX INC156 citations98
US6539508B1Mar 25, 2003
Methods and circuits for testing programmable logic
XILINX INC66 citations96
US6356514B1Mar 12, 2002
Built-in self test method for measuring clock to out delays
XILINX INC40 citations96
US6324672B1Nov 27, 2001
Method for configuring circuits over a data communications link
XILINX INC37 citations96
US6233205B1May 15, 2001
Built-in self test method for measuring clock to out delays
XILINX INC57 citations96
US6891395B2May 10, 2005
Application-specific testing methods for programmable logic devices
XILINX INC43 citations95
US6817006B1Nov 9, 2004
Application-specific testing methods for programmable logic devices
XILINX INC51 citations95
US6466520B1Oct 15, 2002
Built-in AC self test using pulse generators
XILINX INC48 citations94
US7007250B1Feb 28, 2006
Application-specific methods useful for testing look up tables in programmable logic devices
XILINX INC20 citations92
US6232845B1May 15, 2001
Circuit for measuring signal delays in synchronous memory elements
XILINX INC49 citations92
US6075418AJun 13, 2000
System with downstream set or clear for measuring signal propagation delays on integrated circuits
XILINX INC49 citations92
US6069849AMay 30, 2000
Method and system for measuring signal propagation delays using the duty cycle of a ring oscillator
XILINX INC37 citations92
US6651238B1Nov 18, 2003
Providing fault coverage of interconnect in an FPGA
XILINX INC23 citations91
US6611477B1Aug 26, 2003
Built-in self test using pulse generators
XILINX INC25 citations91
US6594610B1Jul 15, 2003
Fault emulation testing of programmable logic devices
XILINX INC36 citations91
US7127697B1Oct 24, 2006
Methods of utilizing programmable logic devices having localized defects in application-specific products
XILINX INC15 citations90
US6664808B2Dec 16, 2003
Method of using partially defective programmable logic devices
XILINX INC26 citations87
US7219314B1May 15, 2007
Application-specific methods for testing molectronic or nanoscale devices
XILINX INC14 citations81
US9012245B1Apr 21, 2015
Methods of making integrated circuit products
XILINX INC5 citations73
US7725787B1May 25, 2010
Testing of a programmable device
XILINX INC5 citations73
US6920621B1Jul 19, 2005
Methods of testing for shorts in programmable logic devices using relative quiescent current measurements
XILINX INC9 citations73
US6594797B1Jul 15, 2003
Methods and circuits for precise edge placement of test signals
XILINX INC11 citations71
US7454675B1Nov 18, 2008
Testing of a programmable device
XILINX INC3 citations62