Inventor

NIU BAOHUA

TW24 patents

⚠️ This page may combine multiple inventors who share the name “NIU BAOHUA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NIU BAOHUA

TAIWAN SEMICONDUCTOR MFG CO LTD

Method and apparatus for measuring magnetic field strength

Method for writing to magnetic random access memory

Magnetic random access memory

Method for writing to magnetic random access memory

Magnetic detection circuit, MRAM and operation method thereof

Apparatus for memory device testing and field applications

Apparatus and method for metrology

Method for writing to magnetic random access memory

Magnetic random access memory

Method and apparatus for measuring magnetic field strength

Method for writing to magnetic random access memory

Magnetic random access memory

Apparatus and method for metrology

Method and apparatus for manufacturing semiconductor device

Semiconductor device having magnetic tunnel junction (MTJ) stack

Magnetic detection circuit, MRAM and operation method thereof

Apparatus for memory device testing and field applications

Method for programming resistive memory cell with AC perturbation AC signal and nonvolatile memory device thereof

Method for inspecting semiconductor device structure

Method and apparatus for manufacturing semiconductor device

Electronic device including a capacitor

ZEISS CARL SMT GMBH

Method and system for testing an integrated circuit

Methods of cross-section imaging of an inspection volume in a wafer

NIU BAOHUA

Through silicon imaging and probing