P

Inventor

SADANA DEVENDRA K

US752 patents
⚠️ This page may combine multiple inventors who share the name “SADANA DEVENDRA K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

45 patents
US6717216B1Apr 6, 2004

SOI based field effect transistor having a compressive film in undercut area under the channel and a method of making the device

IBM282 citations99
US6566177B1May 20, 2003

Silicon-on-insulator vertical array device trench capacitor DRAM

IBM279 citations99
US6541356B2Apr 1, 2003

Ultimate SIMOX

IBM124 citations99
US6214694B1Apr 10, 2001

Process of making densely patterned silicon-on-insulator (SOI) region on a wafer

IBM244 citations99
US9553056B1Jan 24, 2017

Semiconductor chip having tampering feature

IBM31 citations98
US9472588B1Oct 18, 2016

Monolithic visible-infrared focal plane array on silicon

IBM59 citations98
US7358166B2Apr 15, 2008

Relaxed, low-defect SGOI for strained Si CMOS applications

IBM62 citations98
US7087965B2Aug 8, 2006

Strained silicon CMOS on hybrid crystal orientations

IBM97 citations98
US6991998B2Jan 31, 2006

Ultra-thin, high quality strained silicon-on-insulator formed by elastic strain transfer

IBM101 citations98
US6642090B1Nov 4, 2003

Fin FET devices from bulk semiconductor and method for forming

IBM540 citations98
US6426252B1Jul 30, 2002

Silicon-on-insulator vertical array DRAM cell with self-aligned buried strap

IBM95 citations98
US6958286B2Oct 25, 2005

Method of preventing surface roughening during hydrogen prebake of SiGe substrates

IBM238 citations97
US6855436B2Feb 15, 2005

Formation of silicon-germanium-on-insulator (SGOI) by an integral high temperature SIMOX-Ge interdiffusion anneal

IBM50 citations96
US6805962B2Oct 19, 2004

Method of creating high-quality relaxed SiGe-on-insulator for strained Si CMOS applications

IBM52 citations96
US6180486B1Jan 30, 2001

Process of fabricating planar and densely patterned silicon-on-insulator structure

IBM80 citations96
US9654004B1May 16, 2017

3D integrated DC-DC power converters

IBM22 citations94
US9450381B1Sep 20, 2016

Monolithic integrated photonics with lateral bipolar and BiCMOS

IBM29 citations94
US9096050B2Aug 4, 2015

Wafer scale epitaxial graphene transfer

IBM34 citations94
US9401397B1Jul 26, 2016

Reduction of defect induced leakage in III-V semiconductor devices

IBM11 citations93
US9362444B1Jun 7, 2016

Optoelectronics and CMOS integration on GOI substrate

IBM18 citations93
US9293476B2Mar 22, 2016

Integrating active matrix inorganic light emitting diodes for display devices

IBM19 citations93
US8937299B2Jan 20, 2015

III-V finFETs on silicon substrate

IBM40 citations93
US8860005B1Oct 14, 2014

Thin light emitting diode and fabrication method

IBM18 citations93
US7247569B2Jul 24, 2007

Ultra-thin Si MOSFET device structure and method of manufacture

IBM20 citations93
US7172930B2Feb 6, 2007

Strained silicon-on-insulator by anodization of a buried p+ silicon germanium layer

IBM20 citations93
US7141457B2Nov 28, 2006

Method to form Si-containing SOI and underlying substrate with different orientations

IBM15 citations93
US7084460B2Aug 1, 2006

Method for fabricating SiGe-on-insulator (SGOI) and Ge-on-insulator (GOI) substrates

IBM20 citations93
US7084050B2Aug 1, 2006

Formation of silicon-germanium-on-insulator (SGOI) by an integral high temperature SIMOX-Ge interdiffusion anneal

IBM14 citations93
US6946373B2Sep 20, 2005

Relaxed, low-defect SGOI for strained Si CMOS applications

IBM24 citations93
US6888221B1May 3, 2005

BICMOS technology on SIMOX wafers

IBM37 citations93
US6861158B2Mar 1, 2005

Formation of silicon-germanium-on-insulator (SGOI) by an integral high temperature SIMOX-Ge interdiffusion anneal

IBM25 citations93
US6846727B2Jan 25, 2005

Patterned SOI by oxygen implantation and annealing

IBM29 citations93
US6841457B2Jan 11, 2005

Use of hydrogen implantation to improve material properties of silicon-germanium-on-insulator material made by thermal diffusion

IBM40 citations93
US6825102B1Nov 30, 2004

Method of improving the quality of defective semiconductor material

IBM40 citations93
US6602757B2Aug 5, 2003

Self-adjusting thickness uniformity in SOI by high-temperature oxidation of SIMOX and bonded SOI

IBM28 citations93
US6429488B2Aug 6, 2002

Densely patterned silicon-on-insulator (SOI) region on a wafer

IBM33 citations93
US9559240B1Jan 31, 2017

Nano-pillar-based biosensing device

IBM13 citations92
US9059339B1Jun 16, 2015

Light emitting diodes with via contact scheme

IBM21 citations92
US8916451B2Dec 23, 2014

Thin film wafer transfer and structure for electronic devices

IBM29 citations92
US8354694B2Jan 15, 2013

CMOS transistors with stressed high mobility channels

IBM32 citations92
US6884667B1Apr 26, 2005

Field effect transistor with stressed channel and method for making same

IBM36 citations92
US6878611B2Apr 12, 2005

Patterned strained silicon for high performance circuits

IBM29 citations92
US6800518B2Oct 5, 2004

Formation of patterned silicon-on-insulator (SOI)/silicon-on-nothing (SON) composite structure by porous Si engineering

IBM44 citations92
US6743651B2Jun 1, 2004

Method of forming a SiGe-on-insulator substrate using separation by implantation of oxygen

IBM30 citations92
US6486037B2Nov 26, 2002

Control of buried oxide quality in low dose SIMOX

IBM26 citations92

BEDELL STEPHEN W

3 patents

KIM JEE HWAN

1 patent

GLOBALFOUNDRIES INC

1 patent

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