Inventor

FLOEDER STEVEN P

US30 patents

⚠️ This page may combine multiple inventors who share the name “FLOEDER STEVEN P”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FLOEDER STEVEN P

3M INNOVATIVE PROPERTIES CO

Maximization of yield for web-based articles

Apparatus and method for the automated marking of defects on webs of material

Apparatus and method for the automated marking of defects on webs of material

Multi-unit process spatial synchronization of image inspection systems

Apparatus and method for automated web inspection

Multi-roller registered repeat defect detection of a web process line

Inventory control for web-based articles

Web inspection method and device

Preferential defect marking on a web

Maintaining registration of spatially synchronized data for web products

Synchronizing multiple processing systems

Imaging method and apparatus

Optical films having an optical axis and systems and methods for processing same

Infrared light transmission inspection for continuous moving web

3M INNOVATIVE PROPERTIES COMPANY

Virtual camera array for inspection of manufactured webs

Automated inspection for sheet parts of arbitrary shape from manufactured film

Determining dimensions for providing a precut window film

Inspecting sheet goods using deep learning

Manufacturing a product using causal models

Ultraviolet light-based inspection for detecting coating defects in manufactured webs using fluorescing agents

Automated liquid adhesive dispensing using portable measuring device

Active learning management system for automated inspection systems

FLOEDER STEVEN P

Apparatus and method for the automated marking of defects on webs of material

Multi-unit process spatial synchronization

Application-specific repeat defect detection in web manufacturing processes

Optical web-based defect detection using intrasensor uniformity correction

MINNESOTA MINING & MFG

Technique to count objects in a scanned image

3M INNOVATION PROPERTIES COMPA

Low cost thickness measurement method and apparatus for thin coatings

KINDEVA DRUG DELIVERY LP

Process and apparatus for inspecting microneedle arrays

BRITTAIN KENNETH G

Method and apparatus for illuminating material for automated inspection