Inventor
PAIK YOUNG JEEN
US4 patents
Patents
4 patentsUS6961626B1Nov 1, 2005
Dynamic offset and feedback threshold
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US7272459B2Sep 18, 2007
Method, system and medium for controlling manufacture process having multivariate input parameters
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US7096085B2Aug 22, 2006
Process control by distinguishing a white noise component of a process variance
APPLIED MATERIALS INC19 citations89
US7966087B2Jun 21, 2011
Method, system and medium for controlling manufacture process having multivariate input parameters
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