Inventor
KIRMSER STEPHANE
DE3 patents
Patents
3 patentsUS7085972B2Aug 1, 2006
System for testing a group of functionally independent memories and for replacing failing memory words
INFINEON TECHNOLOGIES AG9 citations66
US7945406B2May 17, 2011
Measuring device and method for measuring relative phase shifts of digital signals
INFINEON TECHNOLOGIES AG2 citations59
US7720645B2May 18, 2010
Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device
INFINEON TECHNOLOGIES AG0 citations49