Inventor

OTANI YUKITOSHI

JP7 patents

⚠️ This page may combine multiple inventors who share the name “OTANI YUKITOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FUJI ELECTRIC CO LTD

1 patent

US6665059B2Dec 16, 2003

Method of measuring an inner stress state of disk substrate

FUJI ELECTRIC CO LTD12 citations72

YAMATAKE CORP

1 patent

US6906809B2Jun 14, 2005

Surface shape measuring system

YAMATAKE CORP7 citations71

HOYA CORP

1 patent

US5375009ADec 20, 1994

Optical isolator device having a wider cutoff wavelength band for a return light beam

HOYA CORP11 citations70

UNIV TOKYO NAT UNIV CORP

1 patent

US7796257B2Sep 14, 2010

Measuring apparatus, measuring method, and characteristic measurement unit

UNIV TOKYO NAT UNIV CORP2 citations59

OTANI YUKITOSHI

1 patent

US8107075B2Jan 31, 2012

Optical characteristic measuring apparatus and optical characteristics measuring method

OTANI YUKITOSHI4 citations51

UNIV SAITAMA MEDICAL

1 patent

US9612449B2Apr 4, 2017

Axially symmetric polarization conversion element

UNIV SAITAMA MEDICAL0 citations37

NITTO DENKO CORP

1 patent

US10746664B2Aug 18, 2020

Imaging apparatus for obtaining image of polarizing film, inspection apparatus, and inspection method

NITTO DENKO CORP0 citations35