Inventor
CHO SUNG-BUM
KR21 patents
⚠️ This page may combine multiple inventors who share the name “CHO SUNG-BUM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
18 patentsUS6213856B1Apr 10, 2001
Conditioner and conditioning disk for a CMP pad, and method of fabricating, reworking, and cleaning conditioning disk
SAMSUNG ELECTRONICS CO LTD166 citations98
US6179955B1Jan 30, 2001
Dry etching apparatus for manufacturing semiconductor devices
SAMSUNG ELECTRONICS CO LTD344 citations98
US6464794B1Oct 15, 2002
Process chamber used in manufacture of semiconductor device, capable of reducing contamination by particulates
SAMSUNG ELECTRONICS CO LTD75 citations94
US6146492ANov 14, 2000
Plasma process apparatus with in situ monitoring, monitoring method, and in situ residue cleaning method
SAMSUNG ELECTRONICS CO LTD41 citations90
US7656181B2Feb 2, 2010
Apparatus and method for testing circuit characteristics by using eye mask
SAMSUNG ELECTRONICS CO LTD11 citations81
US6335284B1Jan 1, 2002
Metallization process for manufacturing semiconductor devices
SAMSUNG ELECTRONICS CO LTD16 citations80
US9633711B2Apr 25, 2017
Method of managing data of storage devices responsive to temperature
SAMSUNG ELECTRONICS CO LTD3 citations73
US6940776B2Sep 6, 2005
Semiconductor memory device capable of reading data of signature fuse through normal read operation and method of reading data of signature fuse in semiconductor memory device through normal read operation
SAMSUNG ELECTRONICS CO LTD11 citations73
US6740169B2May 25, 2004
Method of reworking a conditioning disk
SAMSUNG ELECTRONICS CO LTD6 citations73
US5659549AAug 19, 1997
Memory test system having a pattern generator for a multi-bit test
SAMSUNG ELECTRONICS CO LTD16 citations73
US6797109B2Sep 28, 2004
Process chamber used in manufacture of semiconductor device, capable of reducing contamination by particulates
SAMSUNG ELECTRONICS CO LTD7 citations71
US6499492B1Dec 31, 2002
Plasma process apparatus with in situ monitoring, monitoring method, and in situ residue cleaning
SAMSUNG ELECTRONICS CO LTD10 citations71
US7574636B2Aug 11, 2009
Semiconductor memory device
SAMSUNG ELECTRONICS CO LTD4 citations62
US7222273B2May 22, 2007
Apparatus and method for testing semiconductor memory devices, capable of selectively changing frequencies of test pattern signals
SAMSUNG ELECTRONICS CO LTD6 citations62
US6494927B2Dec 17, 2002
Conditioner and conditioning disk for a CMP pad, and method of fabricating, reworking, and cleaning conditioning disk
SAMSUNG ELECTRONICS CO LTD3 citations62
US6596087B2Jul 22, 2003
Method of cleaning conditioning disk
SAMSUNG ELECTRONICS CO LTD0 citations51
US10001756B2Jun 19, 2018
Smart watch including a printed circuit board having a hole at the center
SAMSUNG ELECTRONICS CO LTD1 citations46
US7281179B2Oct 9, 2007
Memory device and input signal control method of a memory device
SAMSUNG ELECTRONICS CO LTD0 citations40