P

Inventor

VAN NEER PAUL LOUIS MARIA JOSEPH

NL25 patents

Patents

25 patents
US12313921B2May 27, 2025

Photonic integrated device for converting sound into a modulation of properties of light in the device

TNO3 citations68
US10317375B2Jun 11, 2019

Method and apparatus for characterizing a medium using ultrasound measurements

TNO3 citations63
US10928361B2Feb 23, 2021

Torsion wave based fluid density measuring device and method

TNO0 citations62
US11965759B2Apr 23, 2024

Device and method for performing ultrasonic measurements of fluid properties

TNO0 citations61
US11749251B2Sep 5, 2023

Control of a piezoelectric transducer array

TNO0 citations59
US11402405B2Aug 2, 2022

Frequency tracking for subsurface atomic force microscopy

TNO0 citations58
US12345916B2Jul 1, 2025

Photonic integrated device for converting a light signal into sound via a solid photo-acoustic converter

TNO0 citations56
US11175165B2Nov 16, 2021

Acoustic measurement of a fluid flow

TNO1 citations53
US12459003B2Nov 4, 2025

Ultrasonic transducer with stacked membranes

TNO0 citations50
US12169187B2Dec 17, 2024

Method of and system for performing subsurface imaging using vibration sensing

TNO0 citations50
US11327092B2May 10, 2022

Subsurface atomic force microscopy with guided ultrasound waves

TNO0 citations50
US11268935B2Mar 8, 2022

Method of and atomic force microscopy system for performing subsurface imaging

TNO0 citations50
US12318811B2Jun 3, 2025

Optimization of an acoustic membrane array

TNO0 citations49
US12004904B2Jun 11, 2024

Configurable adhesive device and method

TNO0 citations49
US11940416B2Mar 26, 2024

Heterodyne scanning probe microscopy method and system

TNO0 citations49
US11067597B2Jul 20, 2021

Method of performing atomic force microscopy with an ultrasound transducer

TNO0 citations48
US11035878B2Jun 15, 2021

Atomic force microscopy system, method for mapping one or more subsurface structures located in a semiconductor device or for monitoring lithographic parameters in a semiconductor device and use of such an atomic force microscopy system

TNO0 citations48
US12510513B2Dec 30, 2025

Acoustic microscope system and method for measuring an object disposed in a medium

TNO0 citations47
US12345737B2Jul 1, 2025

Method, system and computer program for performing acoustic scanning probe microscopy

TNO0 citations47
US11927564B2Mar 12, 2024

Cantilever, ultrasound acoustic microscopy device comprising the cantilever, method of using the same and lithographic system including the same

TNO0 citations45
US12130258B2Oct 29, 2024

Ultrasound sub-surface probe microscopy device and corresponding method

TNO0 citations44
US11635448B2Apr 25, 2023

Heterodyne scanning probe microscopy method and scanning probe microscopy system

TNO0 citations44
US10697896B2Jun 30, 2020

Method and system for measuring a sensor

TNO0 citations39
US12294401B2May 6, 2025

Underwater wearable device, communication system comprising the same and communication method

TNO0 citations36
US10073063B2Sep 11, 2018

Ultrasonic pipeline inspection system and method

TNO0 citations35